Fast concurrent object localization and recognition
Object localization and recognition are important problems in computer vision. However, in many applications, exhaustive search over all object models and image locations is computationally prohibitive. While several methods have been proposed to make either recognition or localization more efficien...
Main Authors: | Yeh, Tom, Lee, John J., Darrell, Trevor J. |
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Other Authors: | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory |
Format: | Article |
Language: | en_US |
Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2012
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Online Access: | http://hdl.handle.net/1721.1/74258 |
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