Nonlinear Device Noise Models:Thermodynamic Requirements
All correspondence concerning this article should be addressed to Prof. John Wyatt
| Main Authors: | , |
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| Format: | Technical Report |
| Language: | English |
| Published: |
2005
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| Online Access: | http://hdl.handle.net/1721.1/7514 |
| _version_ | 1826188605262921728 |
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| author | Wyatt, John L. Jr. Coram, Geoffrey J. |
| author_facet | Wyatt, John L. Jr. Coram, Geoffrey J. |
| author_sort | Wyatt, John L. Jr. |
| collection | MIT |
| description | All correspondence concerning this article should be addressed to
Prof. John Wyatt |
| first_indexed | 2024-09-23T08:02:00Z |
| format | Technical Report |
| id | mit-1721.1/7514 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T08:02:00Z |
| publishDate | 2005 |
| record_format | dspace |
| spelling | mit-1721.1/75142019-04-09T16:12:51Z Nonlinear Device Noise Models:Thermodynamic Requirements Wyatt, John L. Jr. Coram, Geoffrey J. All correspondence concerning this article should be addressed to Prof. John Wyatt This paper proposes three tests to determine whether a given nonlinear device noise model is in agreement with accepted thermodynamic principles. These tests are applied to several models. One conclusion is that every Gaussian noise model for any nonlinear device predicts thermodynamically impossible circuit behavior: these models should be abandoned. But the nonlinear shot-noise model predicts thermodynamically acceptable behavior under a constraint derived here. Further, this constraint specifies the current noise amplitude at each operating point from knowledge of the device v - i curve alone. For the Gaussian and shot-noise models, this paper shows how the thermodynamic requirements can be reduced to concise mathematical tests involving no approximatio Supported by the National Science Foundation Contract No. 94-23221. 2005-01-13T20:15:00Z 2005-01-13T20:15:00Z 1997-10 Technical Report http://hdl.handle.net/1721.1/7514 en Technical Report Massachusetts Institute of Technology, Research Laboratory of Electronics);616 484084 bytes application/pdf application/pdf |
| spellingShingle | Wyatt, John L. Jr. Coram, Geoffrey J. Nonlinear Device Noise Models:Thermodynamic Requirements |
| title | Nonlinear Device Noise Models:Thermodynamic Requirements |
| title_full | Nonlinear Device Noise Models:Thermodynamic Requirements |
| title_fullStr | Nonlinear Device Noise Models:Thermodynamic Requirements |
| title_full_unstemmed | Nonlinear Device Noise Models:Thermodynamic Requirements |
| title_short | Nonlinear Device Noise Models:Thermodynamic Requirements |
| title_sort | nonlinear device noise models thermodynamic requirements |
| url | http://hdl.handle.net/1721.1/7514 |
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