Resolving optical illumination distributions along an axially symmetric photodetecting fiber
Photodetecting fibers of arbitrary length with internal metal, semiconductor and insulator domains have recently been demonstrated. These semiconductor devices exhibit a continuous translational symmetry which presents challenges to the extraction of spatially resolved information. Here, we overcome...
| Main Authors: | , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Optical Society of America
2013
|
| Online Access: | http://hdl.handle.net/1721.1/76605 https://orcid.org/0000-0001-9752-2283 https://orcid.org/0000-0002-7244-3682 |
| Summary: | Photodetecting fibers of arbitrary length with internal metal, semiconductor and insulator domains have recently been demonstrated. These semiconductor devices exhibit a continuous translational symmetry which presents challenges to the extraction of spatially resolved information. Here, we overcome this seemingly fundamental limitation and achieve the detection and spatial localization of a single incident optical beam at sub-centimeter resolution, along a one-meter fiber section. Using an approach that breaks the axial symmetry through the constuction of a convex electrical potential along the fiber axis, we demonstrate the full reconstruction of an arbitrary rectangular optical wave profile. Finally, the localization of up to three points of illumination simultaneously incident on a photodetecting fiber is achieved. |
|---|