Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane

The “textbook” phonon mean free path of heat carrying phonons in silicon at room temperature is ∼40  nm. However, a large contribution to the thermal conductivity comes from low-frequency phonons with much longer mean free paths. We present a simple experiment demonstrating that room-temperature the...

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Main Authors: Johnson, Jeremiah A., Maznev, Alexei, Eliason, Jeffrey Kristian, Nelson, Keith Adam, Cuffe, John, Minnich, Austin Jerome, Kehoe, Timothy, Torres, Clivia M. Sotomayor, Chen, Gang
Other Authors: Massachusetts Institute of Technology. Department of Chemistry
Format: Article
Language:en_US
Published: American Physical Society 2013
Online Access:http://hdl.handle.net/1721.1/77165
https://orcid.org/0000-0002-3968-8530
https://orcid.org/0000-0001-7804-5418
https://orcid.org/0000-0001-9157-6491
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author Johnson, Jeremiah A.
Maznev, Alexei
Eliason, Jeffrey Kristian
Nelson, Keith Adam
Cuffe, John
Minnich, Austin Jerome
Kehoe, Timothy
Torres, Clivia M. Sotomayor
Chen, Gang
author2 Massachusetts Institute of Technology. Department of Chemistry
author_facet Massachusetts Institute of Technology. Department of Chemistry
Johnson, Jeremiah A.
Maznev, Alexei
Eliason, Jeffrey Kristian
Nelson, Keith Adam
Cuffe, John
Minnich, Austin Jerome
Kehoe, Timothy
Torres, Clivia M. Sotomayor
Chen, Gang
author_sort Johnson, Jeremiah A.
collection MIT
description The “textbook” phonon mean free path of heat carrying phonons in silicon at room temperature is ∼40  nm. However, a large contribution to the thermal conductivity comes from low-frequency phonons with much longer mean free paths. We present a simple experiment demonstrating that room-temperature thermal transport in Si significantly deviates from the diffusion model already at micron distances. Absorption of crossed laser pulses in a freestanding silicon membrane sets up a sinusoidal temperature profile that is monitored via diffraction of a probe laser beam. By changing the period of the thermal grating we vary the heat transport distance within the range ∼1–10  μm. At small distances, we observe a reduction in the effective thermal conductivity indicating a transition from the diffusive to the ballistic transport regime for the low-frequency part of the phonon spectrum.
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spelling mit-1721.1/771652022-09-30T12:42:55Z Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane Johnson, Jeremiah A. Maznev, Alexei Eliason, Jeffrey Kristian Nelson, Keith Adam Cuffe, John Minnich, Austin Jerome Kehoe, Timothy Torres, Clivia M. Sotomayor Chen, Gang Massachusetts Institute of Technology. Department of Chemistry Massachusetts Institute of Technology. Department of Mechanical Engineering Johnson, Jeremiah A. Maznev, Alexei Eliason, Jeffrey Kristian Nelson, Keith Adam Minnich, Austin Jerome Chen, Gang The “textbook” phonon mean free path of heat carrying phonons in silicon at room temperature is ∼40  nm. However, a large contribution to the thermal conductivity comes from low-frequency phonons with much longer mean free paths. We present a simple experiment demonstrating that room-temperature thermal transport in Si significantly deviates from the diffusion model already at micron distances. Absorption of crossed laser pulses in a freestanding silicon membrane sets up a sinusoidal temperature profile that is monitored via diffraction of a probe laser beam. By changing the period of the thermal grating we vary the heat transport distance within the range ∼1–10  μm. At small distances, we observe a reduction in the effective thermal conductivity indicating a transition from the diffusive to the ballistic transport regime for the low-frequency part of the phonon spectrum. United States. Dept. of Energy. Office of Science (Award DE-SC0001299) United States. Dept. of Energy. Office of Science (Award DE-FG02-09ER46577) 2013-02-20T20:50:45Z 2013-02-20T20:50:45Z 2013-01 2012-04 Article http://purl.org/eprint/type/JournalArticle 0031-9007 1079-7114 http://hdl.handle.net/1721.1/77165 Johnson, Jeremy A. et al. “Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane.” Physical Review Letters 110.2 (2013). © 2013 American Physical Society https://orcid.org/0000-0002-3968-8530 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0001-9157-6491 en_US http://dx.doi.org/10.1103/PhysRevLett.110.025901 Physical Review Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society APS
spellingShingle Johnson, Jeremiah A.
Maznev, Alexei
Eliason, Jeffrey Kristian
Nelson, Keith Adam
Cuffe, John
Minnich, Austin Jerome
Kehoe, Timothy
Torres, Clivia M. Sotomayor
Chen, Gang
Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane
title Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane
title_full Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane
title_fullStr Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane
title_full_unstemmed Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane
title_short Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane
title_sort direct measurement of room temperature nondiffusive thermal transport over micron distances in a silicon membrane
url http://hdl.handle.net/1721.1/77165
https://orcid.org/0000-0002-3968-8530
https://orcid.org/0000-0001-7804-5418
https://orcid.org/0000-0001-9157-6491
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