Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane
The “textbook” phonon mean free path of heat carrying phonons in silicon at room temperature is ∼40 nm. However, a large contribution to the thermal conductivity comes from low-frequency phonons with much longer mean free paths. We present a simple experiment demonstrating that room-temperature the...
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American Physical Society
2013
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Online Access: | http://hdl.handle.net/1721.1/77165 https://orcid.org/0000-0002-3968-8530 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0001-9157-6491 |
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author | Johnson, Jeremiah A. Maznev, Alexei Eliason, Jeffrey Kristian Nelson, Keith Adam Cuffe, John Minnich, Austin Jerome Kehoe, Timothy Torres, Clivia M. Sotomayor Chen, Gang |
author2 | Massachusetts Institute of Technology. Department of Chemistry |
author_facet | Massachusetts Institute of Technology. Department of Chemistry Johnson, Jeremiah A. Maznev, Alexei Eliason, Jeffrey Kristian Nelson, Keith Adam Cuffe, John Minnich, Austin Jerome Kehoe, Timothy Torres, Clivia M. Sotomayor Chen, Gang |
author_sort | Johnson, Jeremiah A. |
collection | MIT |
description | The “textbook” phonon mean free path of heat carrying phonons in silicon at room temperature is ∼40 nm. However, a large contribution to the thermal conductivity comes from low-frequency phonons with much longer mean free paths. We present a simple experiment demonstrating that room-temperature thermal transport in Si significantly deviates from the diffusion model already at micron distances. Absorption of crossed laser pulses in a freestanding silicon membrane sets up a sinusoidal temperature profile that is monitored via diffraction of a probe laser beam. By changing the period of the thermal grating we vary the heat transport distance within the range ∼1–10 μm. At small distances, we observe a reduction in the effective thermal conductivity indicating a transition from the diffusive to the ballistic transport regime for the low-frequency part of the phonon spectrum. |
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format | Article |
id | mit-1721.1/77165 |
institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T09:00:03Z |
publishDate | 2013 |
publisher | American Physical Society |
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spelling | mit-1721.1/771652022-09-30T12:42:55Z Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane Johnson, Jeremiah A. Maznev, Alexei Eliason, Jeffrey Kristian Nelson, Keith Adam Cuffe, John Minnich, Austin Jerome Kehoe, Timothy Torres, Clivia M. Sotomayor Chen, Gang Massachusetts Institute of Technology. Department of Chemistry Massachusetts Institute of Technology. Department of Mechanical Engineering Johnson, Jeremiah A. Maznev, Alexei Eliason, Jeffrey Kristian Nelson, Keith Adam Minnich, Austin Jerome Chen, Gang The “textbook” phonon mean free path of heat carrying phonons in silicon at room temperature is ∼40 nm. However, a large contribution to the thermal conductivity comes from low-frequency phonons with much longer mean free paths. We present a simple experiment demonstrating that room-temperature thermal transport in Si significantly deviates from the diffusion model already at micron distances. Absorption of crossed laser pulses in a freestanding silicon membrane sets up a sinusoidal temperature profile that is monitored via diffraction of a probe laser beam. By changing the period of the thermal grating we vary the heat transport distance within the range ∼1–10 μm. At small distances, we observe a reduction in the effective thermal conductivity indicating a transition from the diffusive to the ballistic transport regime for the low-frequency part of the phonon spectrum. United States. Dept. of Energy. Office of Science (Award DE-SC0001299) United States. Dept. of Energy. Office of Science (Award DE-FG02-09ER46577) 2013-02-20T20:50:45Z 2013-02-20T20:50:45Z 2013-01 2012-04 Article http://purl.org/eprint/type/JournalArticle 0031-9007 1079-7114 http://hdl.handle.net/1721.1/77165 Johnson, Jeremy A. et al. “Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane.” Physical Review Letters 110.2 (2013). © 2013 American Physical Society https://orcid.org/0000-0002-3968-8530 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0001-9157-6491 en_US http://dx.doi.org/10.1103/PhysRevLett.110.025901 Physical Review Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society APS |
spellingShingle | Johnson, Jeremiah A. Maznev, Alexei Eliason, Jeffrey Kristian Nelson, Keith Adam Cuffe, John Minnich, Austin Jerome Kehoe, Timothy Torres, Clivia M. Sotomayor Chen, Gang Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane |
title | Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane |
title_full | Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane |
title_fullStr | Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane |
title_full_unstemmed | Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane |
title_short | Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane |
title_sort | direct measurement of room temperature nondiffusive thermal transport over micron distances in a silicon membrane |
url | http://hdl.handle.net/1721.1/77165 https://orcid.org/0000-0002-3968-8530 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0001-9157-6491 |
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