General expression for effective diffusivity of foreign atoms migrating via a fast intermediate
In many solids, diffusion of foreign atoms takes place primarily through highly mobile intermediate species that periodically exchange with atoms in the crystalline lattice. The governing reaction-diffusion equations include a diffusion coefficient as well as kinetic parameters describing the exchan...
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
American Institute of Physics (AIP)
2013
|
| Online Access: | http://hdl.handle.net/1721.1/77956 https://orcid.org/0000-0003-4304-3484 |
| _version_ | 1826210711094689792 |
|---|---|
| author | Chen, Kejia Vaidyanathan, Ramakrishnan Seebauer, Edmund G. Braatz, Richard D. |
| author2 | Massachusetts Institute of Technology. Department of Chemical Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Chemical Engineering Chen, Kejia Vaidyanathan, Ramakrishnan Seebauer, Edmund G. Braatz, Richard D. |
| author_sort | Chen, Kejia |
| collection | MIT |
| description | In many solids, diffusion of foreign atoms takes place primarily through highly mobile intermediate species that periodically exchange with atoms in the crystalline lattice. The governing reaction-diffusion equations include a diffusion coefficient as well as kinetic parameters describing the exchange of the intermediate species. Yet it is often convenient to model a diffusive process in terms of a single parameter, no matter what the time regime. This communication derives for a delta function initial profile an exact expression for the effective diffusivity that is valid in all time regimes. In the case of semiconductor solids, such an expression can be helpful in the interpretation of dopant diffusion measurements. |
| first_indexed | 2024-09-23T14:53:56Z |
| format | Article |
| id | mit-1721.1/77956 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T14:53:56Z |
| publishDate | 2013 |
| publisher | American Institute of Physics (AIP) |
| record_format | dspace |
| spelling | mit-1721.1/779562022-10-01T23:15:05Z General expression for effective diffusivity of foreign atoms migrating via a fast intermediate Chen, Kejia Vaidyanathan, Ramakrishnan Seebauer, Edmund G. Braatz, Richard D. Massachusetts Institute of Technology. Department of Chemical Engineering Braatz, Richard D. In many solids, diffusion of foreign atoms takes place primarily through highly mobile intermediate species that periodically exchange with atoms in the crystalline lattice. The governing reaction-diffusion equations include a diffusion coefficient as well as kinetic parameters describing the exchange of the intermediate species. Yet it is often convenient to model a diffusive process in terms of a single parameter, no matter what the time regime. This communication derives for a delta function initial profile an exact expression for the effective diffusivity that is valid in all time regimes. In the case of semiconductor solids, such an expression can be helpful in the interpretation of dopant diffusion measurements. National Science Foundation (U.S.) (Grant DRL 0426328) National Science Foundation (U.S.) (Grant DMR 0704354) 2013-03-21T14:23:59Z 2013-03-21T14:23:59Z 2010-01 2009-07 Article http://purl.org/eprint/type/JournalArticle 0021-8979 1089-7550 http://hdl.handle.net/1721.1/77956 Chen, Kejia et al. “General Expression for Effective Diffusivity of Foreign Atoms Migrating via a Fast Intermediate.” Journal of Applied Physics 107.2 (2010): 026101. ©2010 American Institute of Physics https://orcid.org/0000-0003-4304-3484 en_US http://dx.doi.org/10.1063/1.3294479 Journal of Applied Physics Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Institute of Physics (AIP) MIT Web Domain |
| spellingShingle | Chen, Kejia Vaidyanathan, Ramakrishnan Seebauer, Edmund G. Braatz, Richard D. General expression for effective diffusivity of foreign atoms migrating via a fast intermediate |
| title | General expression for effective diffusivity of foreign atoms migrating via a fast intermediate |
| title_full | General expression for effective diffusivity of foreign atoms migrating via a fast intermediate |
| title_fullStr | General expression for effective diffusivity of foreign atoms migrating via a fast intermediate |
| title_full_unstemmed | General expression for effective diffusivity of foreign atoms migrating via a fast intermediate |
| title_short | General expression for effective diffusivity of foreign atoms migrating via a fast intermediate |
| title_sort | general expression for effective diffusivity of foreign atoms migrating via a fast intermediate |
| url | http://hdl.handle.net/1721.1/77956 https://orcid.org/0000-0003-4304-3484 |
| work_keys_str_mv | AT chenkejia generalexpressionforeffectivediffusivityofforeignatomsmigratingviaafastintermediate AT vaidyanathanramakrishnan generalexpressionforeffectivediffusivityofforeignatomsmigratingviaafastintermediate AT seebaueredmundg generalexpressionforeffectivediffusivityofforeignatomsmigratingviaafastintermediate AT braatzrichardd generalexpressionforeffectivediffusivityofforeignatomsmigratingviaafastintermediate |