Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur

Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur

We apply soft x-ray emission spectroscopy (XES) to measure the electronic structure of crystalline silicon supersaturated with sulfur (up to 0.7 at. %), a candidate intermediate-band solar cell material. Si L[subscript 2,3] emission features are observed above the conventional Si valence band maximu...

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Bibliographic Details
Main Authors: Winkler, Mark Thomas, Newman, Bonna Kay, Buonassisi, Tonio, Wilks, R. G., Weinhardt, L., Recht, D., Said, A. J., Zhang, Y., Blum, M., Krause, S., Yang, W. L., Heske, C., Aziz, Michael J., Bar, M., Sullivan, Joseph Timothy, Ph. D. Massachusetts Institute of Technology
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Language:en_US
Published: American Institute of Physics (AIP) 2013
Online Access:http://hdl.handle.net/1721.1/78016
https://orcid.org/0000-0001-8345-4937

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