Direct and quantitative absorptive spectroscopy of nanowires
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2012.
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Format: | Thesis |
Language: | eng |
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Massachusetts Institute of Technology
2013
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Online Access: | http://hdl.handle.net/1721.1/78197 |
_version_ | 1811081341380329472 |
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author | Tong, Jonathan Kien-Kwok |
author2 | Gang Chen. |
author_facet | Gang Chen. Tong, Jonathan Kien-Kwok |
author_sort | Tong, Jonathan Kien-Kwok |
collection | MIT |
description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2012. |
first_indexed | 2024-09-23T11:45:14Z |
format | Thesis |
id | mit-1721.1/78197 |
institution | Massachusetts Institute of Technology |
language | eng |
last_indexed | 2024-09-23T11:45:14Z |
publishDate | 2013 |
publisher | Massachusetts Institute of Technology |
record_format | dspace |
spelling | mit-1721.1/781972019-04-12T13:31:25Z Direct and quantitative absorptive spectroscopy of nanowires Tong, Jonathan Kien-Kwok Gang Chen. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Mechanical Engineering. Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2012. Cataloged from PDF version of thesis. Includes bibliographical references (p. 125-130). Photonic nanostructures exhibit unique optical properties that are attractive in many different applications. However, measuring the optical properties of individual nanostructures, in particular the absorptive properties, remains a significant challenge. Conventional methods typically provide either an indirect or qualitative measure of absorption. The objective of this thesis is to therefore demonstrate a method capable of directly and quantitatively measuring the absorptive properties of individual nanostructures. This method is based on atomic force microscope (AFM) cantilever thermometry where a bimorph cantilever is used as a heat flux sensor. These sensors operate on the principle of a thermomechanical bending response and by virtue of their dimensionality, are capable of picowatt sensitivity. To validate the use of this technique, a single silicon nanowire is measured. By attaching a silicon nanowire to a cantilever and illuminating the sample with monochromatic light, the absolute absorptance spectrum of the nanowire was measured and shown to match well with theory. This spectroscopic technique can conceivably be used to measure even smaller samples, samples which cannot be characterized using conventional methods. by Jonathan Kien-Kwok Tong. S.M. 2013-03-28T18:13:51Z 2013-03-28T18:13:51Z 2012 2012 Thesis http://hdl.handle.net/1721.1/78197 830378223 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 130 p. application/pdf Massachusetts Institute of Technology |
spellingShingle | Mechanical Engineering. Tong, Jonathan Kien-Kwok Direct and quantitative absorptive spectroscopy of nanowires |
title | Direct and quantitative absorptive spectroscopy of nanowires |
title_full | Direct and quantitative absorptive spectroscopy of nanowires |
title_fullStr | Direct and quantitative absorptive spectroscopy of nanowires |
title_full_unstemmed | Direct and quantitative absorptive spectroscopy of nanowires |
title_short | Direct and quantitative absorptive spectroscopy of nanowires |
title_sort | direct and quantitative absorptive spectroscopy of nanowires |
topic | Mechanical Engineering. |
url | http://hdl.handle.net/1721.1/78197 |
work_keys_str_mv | AT tongjonathankienkwok directandquantitativeabsorptivespectroscopyofnanowires |