Modeling quantum noise for efficient testing of fault-tolerant circuits
Understanding fault-tolerant properties of quantum circuits is important for designing large-scale quantum information processors. In particular, simulating properties of encoded circuits is a crucial tool for investigating the relationship between properties such as the noise model, encoding scheme...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
American Physical Society
2013
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| Online Access: | http://hdl.handle.net/1721.1/78268 |
| _version_ | 1826211667251298304 |
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| author | Magesan, Easwar Puzzuoli, Daniel Granade, Christopher E. Cory, David G. |
| author2 | Massachusetts Institute of Technology. Research Laboratory of Electronics |
| author_facet | Massachusetts Institute of Technology. Research Laboratory of Electronics Magesan, Easwar Puzzuoli, Daniel Granade, Christopher E. Cory, David G. |
| author_sort | Magesan, Easwar |
| collection | MIT |
| description | Understanding fault-tolerant properties of quantum circuits is important for designing large-scale quantum information processors. In particular, simulating properties of encoded circuits is a crucial tool for investigating the relationship between properties such as the noise model, encoding scheme, and threshold value. For general noisy circuits, these simulations quickly become intractable in the size of the encoded circuit. We introduce a general theoretical method for approximating a noise process by one that allows for efficient Monte Carlo simulation of properties of encoded circuits. The approximation is as close to the original process as possible without overestimating its ability to preserve quantum information, a key property for obtaining honest estimates of threshold values. We numerically illustrate the method with various physically relevant noise models. |
| first_indexed | 2024-09-23T15:09:36Z |
| format | Article |
| id | mit-1721.1/78268 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T15:09:36Z |
| publishDate | 2013 |
| publisher | American Physical Society |
| record_format | dspace |
| spelling | mit-1721.1/782682022-10-02T00:57:45Z Modeling quantum noise for efficient testing of fault-tolerant circuits Magesan, Easwar Puzzuoli, Daniel Granade, Christopher E. Cory, David G. Massachusetts Institute of Technology. Research Laboratory of Electronics Magesan, Easwar Understanding fault-tolerant properties of quantum circuits is important for designing large-scale quantum information processors. In particular, simulating properties of encoded circuits is a crucial tool for investigating the relationship between properties such as the noise model, encoding scheme, and threshold value. For general noisy circuits, these simulations quickly become intractable in the size of the encoded circuit. We introduce a general theoretical method for approximating a noise process by one that allows for efficient Monte Carlo simulation of properties of encoded circuits. The approximation is as close to the original process as possible without overestimating its ability to preserve quantum information, a key property for obtaining honest estimates of threshold values. We numerically illustrate the method with various physically relevant noise models. 2013-04-03T16:01:00Z 2013-04-03T16:01:00Z 2013-01 2012-07 Article http://purl.org/eprint/type/JournalArticle 1050-2947 1094-1622 http://hdl.handle.net/1721.1/78268 Magesan, Easwar et al. “Modeling Quantum Noise for Efficient Testing of Fault-tolerant Circuits.” Physical Review A 87.1 (2013). ©2013 American Physical Society en_US http://dx.doi.org/10.1103/PhysRevA.87.012324 Physical Review A Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society APS |
| spellingShingle | Magesan, Easwar Puzzuoli, Daniel Granade, Christopher E. Cory, David G. Modeling quantum noise for efficient testing of fault-tolerant circuits |
| title | Modeling quantum noise for efficient testing of fault-tolerant circuits |
| title_full | Modeling quantum noise for efficient testing of fault-tolerant circuits |
| title_fullStr | Modeling quantum noise for efficient testing of fault-tolerant circuits |
| title_full_unstemmed | Modeling quantum noise for efficient testing of fault-tolerant circuits |
| title_short | Modeling quantum noise for efficient testing of fault-tolerant circuits |
| title_sort | modeling quantum noise for efficient testing of fault tolerant circuits |
| url | http://hdl.handle.net/1721.1/78268 |
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