Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes
A measurement platform is introduced that combines a bilayer cantilever probe with a Fourier transform infrared spectrometer to measure absolute spectral absorptance between wavelengths of 3 μm and 18 μm directly and quantitatively. The enhanced sensitivity provided by the cantilever probe enables t...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | en_US |
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American Institute of Physics
2013
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| Online Access: | http://hdl.handle.net/1721.1/78314 https://orcid.org/0000-0001-8121-8017 https://orcid.org/0000-0002-0898-0803 https://orcid.org/0000-0002-3973-8067 https://orcid.org/0000-0002-3968-8530 |
| _version_ | 1826193412013948928 |
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| author | Hsu, Wei-Chun Tong, Jonathan K. Liao, Bolin Burg, Brian R. Chen, Gang |
| author2 | Massachusetts Institute of Technology. Department of Mechanical Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Mechanical Engineering Hsu, Wei-Chun Tong, Jonathan K. Liao, Bolin Burg, Brian R. Chen, Gang |
| author_sort | Hsu, Wei-Chun |
| collection | MIT |
| description | A measurement platform is introduced that combines a bilayer cantilever probe with a Fourier transform infrared spectrometer to measure absolute spectral absorptance between wavelengths of 3 μm and 18 μm directly and quantitatively. The enhanced sensitivity provided by the cantilever probe enables the quantitative characterization of micro- and nanometer-sized samples. Validation of the technique is carried out by measuring the absorptance spectrum of a doped silicon thin film with a backside aluminum layer and found to agree well with the theoretical predictions. The presented technique is especially attractive for samples such as individual nanowires or nanoparticles, isolated molecules, powders, and photonic structures. |
| first_indexed | 2024-09-23T09:39:09Z |
| format | Article |
| id | mit-1721.1/78314 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T09:39:09Z |
| publishDate | 2013 |
| publisher | American Institute of Physics |
| record_format | dspace |
| spelling | mit-1721.1/783142022-09-26T12:50:06Z Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes Hsu, Wei-Chun Tong, Jonathan K. Liao, Bolin Burg, Brian R. Chen, Gang Massachusetts Institute of Technology. Department of Mechanical Engineering Hsu, Wei-Chun Tong, Jonathan K. Liao, Bolin Burg, Brian R. Chen, Gang A measurement platform is introduced that combines a bilayer cantilever probe with a Fourier transform infrared spectrometer to measure absolute spectral absorptance between wavelengths of 3 μm and 18 μm directly and quantitatively. The enhanced sensitivity provided by the cantilever probe enables the quantitative characterization of micro- and nanometer-sized samples. Validation of the technique is carried out by measuring the absorptance spectrum of a doped silicon thin film with a backside aluminum layer and found to agree well with the theoretical predictions. The presented technique is especially attractive for samples such as individual nanowires or nanoparticles, isolated molecules, powders, and photonic structures. United States. Dept. of Energy (Office of Basic Energy Sciences, Grant No. DE-FG02- 02ER45977) United States. Dept. of Defense (MURI via UIUC FA9550-08-1-0407) National Research Fund Luxembourg (Grant No. 893874) 2013-04-09T21:24:43Z 2013-04-09T21:24:43Z 2013-02 2012-12 Article http://purl.org/eprint/type/JournalArticle 0003-6951 1077-3118 http://hdl.handle.net/1721.1/78314 Hsu, Wei-Chun et al. “Direct and Quantitative Broadband Absorptance Spectroscopy on Small Objects Using Fourier Transform Infrared Spectrometer and Bilayer Cantilever Probes.” Applied Physics Letters 102.5 (2013): 051901. CrossRef. Web. © 2013 American Institute of Physics. https://orcid.org/0000-0001-8121-8017 https://orcid.org/0000-0002-0898-0803 https://orcid.org/0000-0002-3973-8067 https://orcid.org/0000-0002-3968-8530 en_US http://dx.doi.org/10.1063/1.4790184 Applied Physics Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Institute of Physics MIT web domain |
| spellingShingle | Hsu, Wei-Chun Tong, Jonathan K. Liao, Bolin Burg, Brian R. Chen, Gang Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes |
| title | Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes |
| title_full | Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes |
| title_fullStr | Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes |
| title_full_unstemmed | Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes |
| title_short | Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes |
| title_sort | direct and quantitative broadband absorptance spectroscopy on small objects using fourier transform infrared spectrometer and bilayer cantilever probes |
| url | http://hdl.handle.net/1721.1/78314 https://orcid.org/0000-0001-8121-8017 https://orcid.org/0000-0002-0898-0803 https://orcid.org/0000-0002-3973-8067 https://orcid.org/0000-0002-3968-8530 |
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