Voltage-gated modulation of domain wall creep dynamics in an ultrathin metallic ferromagnet

The influence of gate voltage, temperature, and magnetic field on domain wall (DW) creep dynamics is investigated in Pt/Co/gadolinium oxide (GdOx) films with perpendicular magnetic anisotropy and imaged by a scanning magneto-optical Kerr effect technique. The DW creep velocity can be controlled by a...

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Bibliographic Details
Main Authors: Bauer, Uwe, Emori, Satoru, Beach, Geoffrey Stephen
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Language:en_US
Published: American Institute of Physics 2013
Online Access:http://hdl.handle.net/1721.1/79413
https://orcid.org/0000-0002-9998-7276
Description
Summary:The influence of gate voltage, temperature, and magnetic field on domain wall (DW) creep dynamics is investigated in Pt/Co/gadolinium oxide (GdOx) films with perpendicular magnetic anisotropy and imaged by a scanning magneto-optical Kerr effect technique. The DW creep velocity can be controlled by an electric field applied to the Co/GdOx interface via a linear modulation of the activation energy barrier with gate voltage. At low speeds, the DW velocity can be changed significantly by a gate voltage, but the effect is diminished as the DW velocity increases, which limits electric field control of fast DW motion.