Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform

In this paper, we demonstrate high optical quantum efficiency (90%) resonant-cavity-enhanced mid-infrared photodetectors fabricated monolithically on a silicon platform. High quality photoconductive polycrystalline PbTe film is thermally evaporated, oxygen-sensitized at room temperature and acts as...

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Main Authors: Wang, Jianfei, Hu, Juejun, Becla, Piotr, Kimerling, Lionel C., Agarwal, Anuradha Murthy
Other Authors: MIT Materials Research Laboratory
Format: Article
Language:en_US
Published: Optical Society of America 2013
Online Access:http://hdl.handle.net/1721.1/79731
https://orcid.org/0000-0002-7233-3918
https://orcid.org/0000-0002-0769-0652
https://orcid.org/0000-0002-3913-6189
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author Wang, Jianfei
Hu, Juejun
Becla, Piotr
Kimerling, Lionel C.
Agarwal, Anuradha Murthy
author2 MIT Materials Research Laboratory
author_facet MIT Materials Research Laboratory
Wang, Jianfei
Hu, Juejun
Becla, Piotr
Kimerling, Lionel C.
Agarwal, Anuradha Murthy
author_sort Wang, Jianfei
collection MIT
description In this paper, we demonstrate high optical quantum efficiency (90%) resonant-cavity-enhanced mid-infrared photodetectors fabricated monolithically on a silicon platform. High quality photoconductive polycrystalline PbTe film is thermally evaporated, oxygen-sensitized at room temperature and acts as the infrared absorber. The cavity-enhanced detector operates in the critical coupling regime and shows a peak responsivity of 100 V/W at the resonant wavelength of 3.5 μm, 13.4 times higher compared to blanket PbTe film of the same thickness. Detectivity as high as 0.72 × 10[superscript 9] cmHz[superscript 1/2]W[superscript −1] has been measured, comparable with commercial polycrystalline mid-infrared photodetectors. As low temperature processing (< 160 °C) is implemented in the entire fabrication process, our detector is promising for monolithic integration with Si readout integrated circuits.
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spelling mit-1721.1/797312022-10-01T19:55:15Z Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform Wang, Jianfei Hu, Juejun Becla, Piotr Kimerling, Lionel C. Agarwal, Anuradha Murthy MIT Materials Research Laboratory Massachusetts Institute of Technology. Department of Materials Science and Engineering Wang, Jianfei Hu, Juejun Becla, Piotr Agarwal, Anuradha Murthy Kimerling, Lionel C. In this paper, we demonstrate high optical quantum efficiency (90%) resonant-cavity-enhanced mid-infrared photodetectors fabricated monolithically on a silicon platform. High quality photoconductive polycrystalline PbTe film is thermally evaporated, oxygen-sensitized at room temperature and acts as the infrared absorber. The cavity-enhanced detector operates in the critical coupling regime and shows a peak responsivity of 100 V/W at the resonant wavelength of 3.5 μm, 13.4 times higher compared to blanket PbTe film of the same thickness. Detectivity as high as 0.72 × 10[superscript 9] cmHz[superscript 1/2]W[superscript −1] has been measured, comparable with commercial polycrystalline mid-infrared photodetectors. As low temperature processing (< 160 °C) is implemented in the entire fabrication process, our detector is promising for monolithic integration with Si readout integrated circuits. 2013-07-30T18:36:59Z 2013-07-30T18:36:59Z 2010-06 2010-05 Article http://purl.org/eprint/type/JournalArticle 1094-4087 http://hdl.handle.net/1721.1/79731 Wang, Jianfei, Juejun Hu, Piotr Becla, Anuradha M. Agarwal, and Lionel C. Kimerling. “Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform.” Optics Express 18, no. 12 (June 1, 2010): 12890. © 2010 OSA https://orcid.org/0000-0002-7233-3918 https://orcid.org/0000-0002-0769-0652 https://orcid.org/0000-0002-3913-6189 en_US http://dx.doi.org/10.1364/OE.18.012890 Optics Express Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Optical Society of America MIT web domain
spellingShingle Wang, Jianfei
Hu, Juejun
Becla, Piotr
Kimerling, Lionel C.
Agarwal, Anuradha Murthy
Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform
title Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform
title_full Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform
title_fullStr Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform
title_full_unstemmed Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform
title_short Resonant-cavity-enhanced mid-infrared photodetector on a silicon platform
title_sort resonant cavity enhanced mid infrared photodetector on a silicon platform
url http://hdl.handle.net/1721.1/79731
https://orcid.org/0000-0002-7233-3918
https://orcid.org/0000-0002-0769-0652
https://orcid.org/0000-0002-3913-6189
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AT kimerlinglionelc resonantcavityenhancedmidinfraredphotodetectoronasiliconplatform
AT agarwalanuradhamurthy resonantcavityenhancedmidinfraredphotodetectoronasiliconplatform