Towards an integrated materials characterization toolbox
The material characterization toolbox has recently experienced a number of parallel revolutionary advances, foreshadowing a time in the near future when material scientists can quantify material structure evolution across spatial and temporal space simultaneously. This will provide insight to reacti...
| Main Authors: | , , , , , , , , , , , , , , , , , , , , |
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| Format: | Article |
| Language: | en_US |
| Published: |
Cambridge University Press (Materials Research Society)
2013
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| Online Access: | http://hdl.handle.net/1721.1/79779 https://orcid.org/0000-0001-9856-2682 |
| _version_ | 1826209906265423872 |
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| author | Robertson, Ian M. Schuh, Christopher A. Vetrano, John S. Browning, Nigel D. Field, David P. Jensen, Dorte Juul Miller, Michael K. Baker, Ian Dunand, David C. Dunin-Borkowski, Rafal Kabius, Bernd Kelly, Tom Lozano-Perez, Sergio Misra, Amit Rohrer, Gregory S. Rollett, Anthony D. Taheri, Mitra L. Thompson, Greg B. Uchic, Michael Wang, Xun-Li Was, Gary |
| author2 | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Materials Science and Engineering Robertson, Ian M. Schuh, Christopher A. Vetrano, John S. Browning, Nigel D. Field, David P. Jensen, Dorte Juul Miller, Michael K. Baker, Ian Dunand, David C. Dunin-Borkowski, Rafal Kabius, Bernd Kelly, Tom Lozano-Perez, Sergio Misra, Amit Rohrer, Gregory S. Rollett, Anthony D. Taheri, Mitra L. Thompson, Greg B. Uchic, Michael Wang, Xun-Li Was, Gary |
| author_sort | Robertson, Ian M. |
| collection | MIT |
| description | The material characterization toolbox has recently experienced a number of parallel revolutionary advances, foreshadowing a time in the near future when material scientists can quantify material structure evolution across spatial and temporal space simultaneously. This will provide insight to reaction dynamics in four-dimensions, spanning multiple orders of magnitude in both temporal and spatial space. This study presents the authors’ viewpoint on the material characterization field, reviewing its recent past, evaluating its present capabilities, and proposing directions for its future development. Electron microscopy; atom probe tomography; x-ray, neutron and electron tomography; serial sectioning tomography; and diffraction-based analysis methods are reviewed, and opportunities for their future development are highlighted. Advances in surface probe microscopy have been reviewed recently and, therefore, are not included [D.A. Bonnell et al.: Rev. Modern Phys. in Review]. In this study particular attention is paid to studies that have pioneered the synergetic use of multiple techniques to provide complementary views of a single structure or process; several of these studies represent the state-of-the-art in characterization and suggest a trajectory for the continued development of the field. Based on this review, a set of grand challenges for characterization science is identified, including suggestions for instrumentation advances, scientific problems in microstructure analysis, and complex structure evolution problems involving material damage. The future of microstructural characterization is proposed to be one not only where individual techniques are pushed to their limits, but where the community devises strategies of technique synergy to address complex multiscale problems in materials science and engineering. |
| first_indexed | 2024-09-23T14:34:48Z |
| format | Article |
| id | mit-1721.1/79779 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T14:34:48Z |
| publishDate | 2013 |
| publisher | Cambridge University Press (Materials Research Society) |
| record_format | dspace |
| spelling | mit-1721.1/797792022-09-29T09:52:42Z Towards an integrated materials characterization toolbox Robertson, Ian M. Schuh, Christopher A. Vetrano, John S. Browning, Nigel D. Field, David P. Jensen, Dorte Juul Miller, Michael K. Baker, Ian Dunand, David C. Dunin-Borkowski, Rafal Kabius, Bernd Kelly, Tom Lozano-Perez, Sergio Misra, Amit Rohrer, Gregory S. Rollett, Anthony D. Taheri, Mitra L. Thompson, Greg B. Uchic, Michael Wang, Xun-Li Was, Gary Massachusetts Institute of Technology. Department of Materials Science and Engineering Schuh, Christopher A. The material characterization toolbox has recently experienced a number of parallel revolutionary advances, foreshadowing a time in the near future when material scientists can quantify material structure evolution across spatial and temporal space simultaneously. This will provide insight to reaction dynamics in four-dimensions, spanning multiple orders of magnitude in both temporal and spatial space. This study presents the authors’ viewpoint on the material characterization field, reviewing its recent past, evaluating its present capabilities, and proposing directions for its future development. Electron microscopy; atom probe tomography; x-ray, neutron and electron tomography; serial sectioning tomography; and diffraction-based analysis methods are reviewed, and opportunities for their future development are highlighted. Advances in surface probe microscopy have been reviewed recently and, therefore, are not included [D.A. Bonnell et al.: Rev. Modern Phys. in Review]. In this study particular attention is paid to studies that have pioneered the synergetic use of multiple techniques to provide complementary views of a single structure or process; several of these studies represent the state-of-the-art in characterization and suggest a trajectory for the continued development of the field. Based on this review, a set of grand challenges for characterization science is identified, including suggestions for instrumentation advances, scientific problems in microstructure analysis, and complex structure evolution problems involving material damage. The future of microstructural characterization is proposed to be one not only where individual techniques are pushed to their limits, but where the community devises strategies of technique synergy to address complex multiscale problems in materials science and engineering. United States. Dept. of Energy. Office of Basic Energy Sciences (Council of Materials Science and Engineering) National Science Foundation (U.S.) (Grant DMR-0855402) 2013-08-05T16:05:05Z 2013-08-05T16:05:05Z 2011-06 2011-01 Article http://purl.org/eprint/type/JournalArticle 0884-2914 2044-5326 http://hdl.handle.net/1721.1/79779 Robertson, Ian M., Christopher A. Schuh, John S. Vetrano, Nigel D. Browning, David P. Field, Dorte Juul Jensen, Michael K. Miller, et al. “Towards an integrated materials characterization toolbox.” Journal of Materials Research 26, no. 11 (June 7, 2011): 1341-1383. Copyright © Materials Research Society 2011 https://orcid.org/0000-0001-9856-2682 en_US http://dx.doi.org/10.1557/jmr.2011.41 Journal of Materials Research Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Cambridge University Press (Materials Research Society) MIT web domain |
| spellingShingle | Robertson, Ian M. Schuh, Christopher A. Vetrano, John S. Browning, Nigel D. Field, David P. Jensen, Dorte Juul Miller, Michael K. Baker, Ian Dunand, David C. Dunin-Borkowski, Rafal Kabius, Bernd Kelly, Tom Lozano-Perez, Sergio Misra, Amit Rohrer, Gregory S. Rollett, Anthony D. Taheri, Mitra L. Thompson, Greg B. Uchic, Michael Wang, Xun-Li Was, Gary Towards an integrated materials characterization toolbox |
| title | Towards an integrated materials characterization toolbox |
| title_full | Towards an integrated materials characterization toolbox |
| title_fullStr | Towards an integrated materials characterization toolbox |
| title_full_unstemmed | Towards an integrated materials characterization toolbox |
| title_short | Towards an integrated materials characterization toolbox |
| title_sort | towards an integrated materials characterization toolbox |
| url | http://hdl.handle.net/1721.1/79779 https://orcid.org/0000-0001-9856-2682 |
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