Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition

The chemomechanical and electrical properties of (Pr,Ce)O[subscript 2-δ] thin films were studied between 30 and 875°C in air by in situ X-ray diffraction and complex impedance spectroscopy measurements. Reduction/oxidation reactions produced large stress variations (∼2 GPa) in the structure. Atomist...

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Bibliographic Details
Main Authors: Marrocchelli, Dario, Bishop, Sean, Yildiz, Bilge, Tuller, Harry L., Kuru, Yener, Chen, Di
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Language:en_US
Published: The Electrochemical Society 2013
Online Access:http://hdl.handle.net/1721.1/79807
https://orcid.org/0000-0001-8339-3222
https://orcid.org/0000-0002-2688-5666
https://orcid.org/0000-0002-2187-9240
Description
Summary:The chemomechanical and electrical properties of (Pr,Ce)O[subscript 2-δ] thin films were studied between 30 and 875°C in air by in situ X-ray diffraction and complex impedance spectroscopy measurements. Reduction/oxidation reactions produced large stress variations (∼2 GPa) in the structure. Atomistic simulation techniques were employed to investigate the mechanisms behind the observed chemical expansion behavior, suggesting the possible roles of defect ordering upon cooling and heating. An alternative explanation based on a metastable frozen in state of higher reduction is also considered. Similar phenonena, observed here in Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ], are expected to be applicable and of potential significance for other technologically important complex oxides such as perovskite-structured materials.