Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition
The chemomechanical and electrical properties of (Pr,Ce)O[subscript 2-δ] thin films were studied between 30 and 875°C in air by in situ X-ray diffraction and complex impedance spectroscopy measurements. Reduction/oxidation reactions produced large stress variations (∼2 GPa) in the structure. Atomist...
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The Electrochemical Society
2013
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| Online Access: | http://hdl.handle.net/1721.1/79807 https://orcid.org/0000-0001-8339-3222 https://orcid.org/0000-0002-2688-5666 https://orcid.org/0000-0002-2187-9240 |
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| author | Marrocchelli, Dario Bishop, Sean Yildiz, Bilge Tuller, Harry L. Kuru, Yener Chen, Di |
| author2 | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Materials Science and Engineering Marrocchelli, Dario Bishop, Sean Yildiz, Bilge Tuller, Harry L. Kuru, Yener Chen, Di |
| author_sort | Marrocchelli, Dario |
| collection | MIT |
| description | The chemomechanical and electrical properties of (Pr,Ce)O[subscript 2-δ] thin films were studied between 30 and 875°C in air by in situ X-ray diffraction and complex impedance spectroscopy measurements. Reduction/oxidation reactions produced large stress variations (∼2 GPa) in the structure. Atomistic simulation techniques were employed to investigate the mechanisms behind the observed chemical expansion behavior, suggesting the possible roles of defect ordering upon cooling and heating. An alternative explanation based on a metastable frozen in state of higher reduction is also considered. Similar phenonena, observed here in Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ], are expected to be applicable and of potential significance for other technologically important complex oxides such as perovskite-structured materials. |
| first_indexed | 2024-09-23T12:04:44Z |
| format | Article |
| id | mit-1721.1/79807 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T12:04:44Z |
| publishDate | 2013 |
| publisher | The Electrochemical Society |
| record_format | dspace |
| spelling | mit-1721.1/798072023-02-26T02:09:20Z Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition Marrocchelli, Dario Bishop, Sean Yildiz, Bilge Tuller, Harry L. Kuru, Yener Chen, Di Massachusetts Institute of Technology. Department of Materials Science and Engineering Massachusetts Institute of Technology. Department of Nuclear Science and Engineering Kuru, Y. Marrocchelli, Dario Bishop, Sean Chen, D. Yildiz, Bilge Tuller, Harry L. The chemomechanical and electrical properties of (Pr,Ce)O[subscript 2-δ] thin films were studied between 30 and 875°C in air by in situ X-ray diffraction and complex impedance spectroscopy measurements. Reduction/oxidation reactions produced large stress variations (∼2 GPa) in the structure. Atomistic simulation techniques were employed to investigate the mechanisms behind the observed chemical expansion behavior, suggesting the possible roles of defect ordering upon cooling and heating. An alternative explanation based on a metastable frozen in state of higher reduction is also considered. Similar phenonena, observed here in Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ], are expected to be applicable and of potential significance for other technologically important complex oxides such as perovskite-structured materials. United States. Dept. of Energy. Office of Basic Energy Sciences (Award DE SC0002633) MIT Energy Initiative (Seed Fund Program) 2013-08-08T17:19:34Z 2013-08-08T17:19:34Z 2012-09 2012-08 Article http://purl.org/eprint/type/JournalArticle 0013-4651 1945-7111 http://hdl.handle.net/1721.1/79807 Kuru, Y., D. Marrocchelli, S. R. Bishop, D. Chen, B. Yildiz, and H. L. Tuller. “Anomalous Chemical Expansion Behavior of Pr0.2Ce0.8O2- Thin Films Grown by Pulsed Laser Deposition.” Journal of the Electrochemical Society 159, no. 11 (January 1, 2012): F799-F803. © 2012 The Electrochemical Society https://orcid.org/0000-0001-8339-3222 https://orcid.org/0000-0002-2688-5666 https://orcid.org/0000-0002-2187-9240 en_US http://dx.doi.org/10.1149/2.016212jes Journal of the Electrochemical Society Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf The Electrochemical Society MIT web domain |
| spellingShingle | Marrocchelli, Dario Bishop, Sean Yildiz, Bilge Tuller, Harry L. Kuru, Yener Chen, Di Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition |
| title | Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition |
| title_full | Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition |
| title_fullStr | Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition |
| title_full_unstemmed | Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition |
| title_short | Anomalous Chemical Expansion Behavior of Pr[subscript 0.2]Ce[subscript 0.8]O[subscript 2-δ] Thin Films Grown by Pulsed Laser Deposition |
| title_sort | anomalous chemical expansion behavior of pr subscript 0 2 ce subscript 0 8 o subscript 2 δ thin films grown by pulsed laser deposition |
| url | http://hdl.handle.net/1721.1/79807 https://orcid.org/0000-0001-8339-3222 https://orcid.org/0000-0002-2688-5666 https://orcid.org/0000-0002-2187-9240 |
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