APA (7th ed.) Citation

Dublon, G., Paradiso, J. A., Mayton, B. D., Palacios, S. R., & Science, M. I. o. T. D. o. E. E. a. C. (2013). TRUSS: Tracking Risk with Ubiquitous Smart Sensing. Institute of Electrical and Electronics Engineers (IEEE).

Chicago Style (17th ed.) Citation

Dublon, Gershon, Joseph A. Paradiso, Brian Dean Mayton, Sebastian Ricardo Palacios, and Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. TRUSS: Tracking Risk with Ubiquitous Smart Sensing. Institute of Electrical and Electronics Engineers (IEEE), 2013.

MLA (9th ed.) Citation

Dublon, Gershon, et al. TRUSS: Tracking Risk with Ubiquitous Smart Sensing. Institute of Electrical and Electronics Engineers (IEEE), 2013.