Single view reflectance capture using multiplexed scattering and time-of-flight imaging
This paper introduces the concept of time-of-flight reflectance estimation, and demonstrates a new technique that allows a camera to rapidly acquire reflectance properties of objects from a single view-point, over relatively long distances and without encircling equipment. We measure material proper...
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| Format: | Article |
| Language: | en_US |
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Association for Computing Machinery (ACM)
2013
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| Online Access: | http://hdl.handle.net/1721.1/80876 https://orcid.org/0000-0002-9894-8865 https://orcid.org/0000-0002-3254-3224 |
| _version_ | 1826197316337401856 |
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| author | Zhao, Shuang Velten, Andreas Raskar, Ramesh Bala, Kavita Naik, Nikhil Deepak |
| author2 | Massachusetts Institute of Technology. Media Laboratory |
| author_facet | Massachusetts Institute of Technology. Media Laboratory Zhao, Shuang Velten, Andreas Raskar, Ramesh Bala, Kavita Naik, Nikhil Deepak |
| author_sort | Zhao, Shuang |
| collection | MIT |
| description | This paper introduces the concept of time-of-flight reflectance estimation, and demonstrates a new technique that allows a camera to rapidly acquire reflectance properties of objects from a single view-point, over relatively long distances and without encircling equipment. We measure material properties by indirectly illuminating an object by a laser source, and observing its reflected light indirectly using a time-of-flight camera. The configuration collectively acquires dense angular, but low spatial sampling, within a limited solid angle range - all from a single viewpoint. Our ultra-fast imaging approach captures space-time "streak images" that can separate out different bounces of light based on path length. Entanglements arise in the streak images mixing signals from multiple paths if they have the same total path length. We show how reflectances can be recovered by solving for a linear system of equations and assuming parametric material models; fitting to lower dimensional reflectance models enables us to disentangle measurements.
We demonstrate proof-of-concept results of parametric reflectance models for homogeneous and discretized heterogeneous patches, both using simulation and experimental hardware. As compared to lengthy or highly calibrated BRDF acquisition techniques, we demonstrate a device that can rapidly, on the order of seconds, capture meaningful reflectance information. We expect hardware advances to improve the portability and speed of this device. |
| first_indexed | 2024-09-23T10:46:09Z |
| format | Article |
| id | mit-1721.1/80876 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T10:46:09Z |
| publishDate | 2013 |
| publisher | Association for Computing Machinery (ACM) |
| record_format | dspace |
| spelling | mit-1721.1/808762022-09-27T14:48:23Z Single view reflectance capture using multiplexed scattering and time-of-flight imaging Zhao, Shuang Velten, Andreas Raskar, Ramesh Bala, Kavita Naik, Nikhil Deepak Massachusetts Institute of Technology. Media Laboratory Program in Media Arts and Sciences (Massachusetts Institute of Technology) Naik, Nikhil Deepak Velten, Andreas Raskar, Ramesh This paper introduces the concept of time-of-flight reflectance estimation, and demonstrates a new technique that allows a camera to rapidly acquire reflectance properties of objects from a single view-point, over relatively long distances and without encircling equipment. We measure material properties by indirectly illuminating an object by a laser source, and observing its reflected light indirectly using a time-of-flight camera. The configuration collectively acquires dense angular, but low spatial sampling, within a limited solid angle range - all from a single viewpoint. Our ultra-fast imaging approach captures space-time "streak images" that can separate out different bounces of light based on path length. Entanglements arise in the streak images mixing signals from multiple paths if they have the same total path length. We show how reflectances can be recovered by solving for a linear system of equations and assuming parametric material models; fitting to lower dimensional reflectance models enables us to disentangle measurements. We demonstrate proof-of-concept results of parametric reflectance models for homogeneous and discretized heterogeneous patches, both using simulation and experimental hardware. As compared to lengthy or highly calibrated BRDF acquisition techniques, we demonstrate a device that can rapidly, on the order of seconds, capture meaningful reflectance information. We expect hardware advances to improve the portability and speed of this device. National Science Foundation (U.S.) (Award CCF-0644175) National Science Foundation (U.S.) (Award CCF-0811680) National Science Foundation (U.S.) (Award IIS-1011919) Intel Corporation (PhD Fellowship) Alfred P. Sloan Foundation (Research Fellowship) 2013-09-23T17:55:11Z 2013-09-23T17:55:11Z 2011-12 Article http://purl.org/eprint/type/ConferencePaper 0730-0301 http://hdl.handle.net/1721.1/80876 Nikhil Naik, Shuang Zhao, Andreas Velten, Ramesh Raskar, and Kavita Bala. 2011. Single view reflectance capture using multiplexed scattering and time-of-flight imaging. ACM Trans. Graph. 30, 6, Article 171 (December 2011), 10 pages. https://orcid.org/0000-0002-9894-8865 https://orcid.org/0000-0002-3254-3224 en_US http://dx.doi.org/10.1145/2024156.2024205 ACM Transactions on Graphics Creative Commons Attribution-Noncommercial-Share Alike 3.0 http://creativecommons.org/licenses/by-nc-sa/3.0/ application/pdf Association for Computing Machinery (ACM) MIT Web Domain |
| spellingShingle | Zhao, Shuang Velten, Andreas Raskar, Ramesh Bala, Kavita Naik, Nikhil Deepak Single view reflectance capture using multiplexed scattering and time-of-flight imaging |
| title | Single view reflectance capture using multiplexed scattering and time-of-flight imaging |
| title_full | Single view reflectance capture using multiplexed scattering and time-of-flight imaging |
| title_fullStr | Single view reflectance capture using multiplexed scattering and time-of-flight imaging |
| title_full_unstemmed | Single view reflectance capture using multiplexed scattering and time-of-flight imaging |
| title_short | Single view reflectance capture using multiplexed scattering and time-of-flight imaging |
| title_sort | single view reflectance capture using multiplexed scattering and time of flight imaging |
| url | http://hdl.handle.net/1721.1/80876 https://orcid.org/0000-0002-9894-8865 https://orcid.org/0000-0002-3254-3224 |
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