Single view reflectance capture using multiplexed scattering and time-of-flight imaging
This paper introduces the concept of time-of-flight reflectance estimation, and demonstrates a new technique that allows a camera to rapidly acquire reflectance properties of objects from a single view-point, over relatively long distances and without encircling equipment. We measure material proper...
| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Association for Computing Machinery (ACM)
2013
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| Online Access: | http://hdl.handle.net/1721.1/80876 https://orcid.org/0000-0002-9894-8865 https://orcid.org/0000-0002-3254-3224 |