APA (7th ed.) Citation

Rubner, M. F., Cohen, R. E., Gilbert, J. B., & Laboratory, M. M. R. (2013). Depth-profiling X-ray photoelectron spectroscopy (XPS) analysis of interlayer diffusion in polyelectrolyte multilayers. National Academy of Sciences (U.S.).

Chicago Style (17th ed.) Citation

Rubner, Michael F., Robert E. Cohen, Jonathan Brian Gilbert, and MIT Materials Research Laboratory. Depth-profiling X-ray Photoelectron Spectroscopy (XPS) Analysis of Interlayer Diffusion in Polyelectrolyte Multilayers. National Academy of Sciences (U.S.), 2013.

MLA (9th ed.) Citation

Rubner, Michael F., et al. Depth-profiling X-ray Photoelectron Spectroscopy (XPS) Analysis of Interlayer Diffusion in Polyelectrolyte Multilayers. National Academy of Sciences (U.S.), 2013.