Electrical degradation of InAlAs/InGaAs metamorphic high electron mobility transistors

Electrical degradation of InAlAs/InGaAs metamorphic high electron mobility transistors

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.

Bibliographic Details
Main Author: Mertens, Samuel D. (Samuel David), 1975-
Other Authors: Jesús A. del Alamo and Lawrence G. Studebaker.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2014
Subjects:
Electrical Engineering and Computer Science
Online Access:http://hdl.handle.net/1721.1/84210
Description
Summary:Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.

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