On the methodology of assessing hot-carrier reliability of analog circuits
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.
| Main Author: | |
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| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
| Published: |
Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/84212 |
| _version_ | 1826194459648327680 |
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| author | Le, Huy X. P |
| author2 | James E. Chung and Paul J. Marcoux. |
| author_facet | James E. Chung and Paul J. Marcoux. Le, Huy X. P |
| author_sort | Le, Huy X. P |
| collection | MIT |
| description | Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999. |
| first_indexed | 2024-09-23T09:56:08Z |
| format | Thesis |
| id | mit-1721.1/84212 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T09:56:08Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/842122019-04-11T11:01:33Z On the methodology of assessing hot-carrier reliability of analog circuits Le, Huy X. P James E. Chung and Paul J. Marcoux. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999. Includes bibliographical references (leaves 112-116). by Huy X.P. Le. Ph.D. 2014-01-23T18:29:03Z 2014-01-23T18:29:03Z 1999 1999 Thesis http://hdl.handle.net/1721.1/84212 47078390 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 116 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Le, Huy X. P On the methodology of assessing hot-carrier reliability of analog circuits |
| title | On the methodology of assessing hot-carrier reliability of analog circuits |
| title_full | On the methodology of assessing hot-carrier reliability of analog circuits |
| title_fullStr | On the methodology of assessing hot-carrier reliability of analog circuits |
| title_full_unstemmed | On the methodology of assessing hot-carrier reliability of analog circuits |
| title_short | On the methodology of assessing hot-carrier reliability of analog circuits |
| title_sort | on the methodology of assessing hot carrier reliability of analog circuits |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/84212 |
| work_keys_str_mv | AT lehuyxp onthemethodologyofassessinghotcarrierreliabilityofanalogcircuits |