On the methodology of assessing hot-carrier reliability of analog circuits

On the methodology of assessing hot-carrier reliability of analog circuits

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.

Bibliographic Details
Main Author: Le, Huy X. P
Other Authors: James E. Chung and Paul J. Marcoux.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2014
Subjects:
Electrical Engineering and Computer Science.
Online Access:http://hdl.handle.net/1721.1/84212

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