Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.
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| Бусад зохиолчид: | |
| Формат: | Дипломын ажил |
| Хэл сонгох: | eng |
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Massachusetts Institute of Technology
2014
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| Онлайн хандалт: | http://hdl.handle.net/1721.1/84226 |
| Тойм: | Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001. |
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