Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/84226 |
| _version_ | 1811071855791964160 |
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| author | Howe, Jonathan E. (Jonathan Emerson), 1973- |
| author2 | Stephen C. Graves and Stanley B. Gershwin. |
| author_facet | Stephen C. Graves and Stanley B. Gershwin. Howe, Jonathan E. (Jonathan Emerson), 1973- |
| author_sort | Howe, Jonathan E. (Jonathan Emerson), 1973- |
| collection | MIT |
| description | Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001. |
| first_indexed | 2024-09-23T08:57:07Z |
| format | Thesis |
| id | mit-1721.1/84226 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T08:57:07Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/842262019-04-10T19:54:07Z Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes Howe, Jonathan E. (Jonathan Emerson), 1973- Stephen C. Graves and Stanley B. Gershwin. Massachusetts Institute of Technology. Department of Mechanical Engineering. Sloan School of Management. Massachusetts Institute of Technology. Department of Mechanical Engineering. Sloan School of Management. Mechanical Engineering. Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001. Includes bibliographical references (p. 73). by Jonathan E. Howe. S.M. 2014-01-23T18:29:59Z 2014-01-23T18:29:59Z 2001 2001 Thesis http://hdl.handle.net/1721.1/84226 48862861 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 82 p. application/pdf Massachusetts Institute of Technology |
| spellingShingle | Sloan School of Management. Mechanical Engineering. Howe, Jonathan E. (Jonathan Emerson), 1973- Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes |
| title | Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes |
| title_full | Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes |
| title_fullStr | Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes |
| title_full_unstemmed | Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes |
| title_short | Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes |
| title_sort | minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes |
| topic | Sloan School of Management. Mechanical Engineering. |
| url | http://hdl.handle.net/1721.1/84226 |
| work_keys_str_mv | AT howejonathanejonathanemerson1973 minimizingtheriskqualificationtestwafershaveonthemanufacturingreadingsofanewmicroprocessorfabricationsitethroughdataprocesses |