Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes

Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes

Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.

Detaylı Bibliyografya
Yazar:	Howe, Jonathan E. (Jonathan Emerson), 1973-
Diğer Yazarlar:	Stephen C. Graves and Stanley B. Gershwin.
Materyal Türü:	Tez
Dil:	eng
Baskı/Yayın Bilgisi:	Massachusetts Institute of Technology 2014
Konular:	Sloan School of Management. Mechanical Engineering.
Online Erişim:	http://hdl.handle.net/1721.1/84226

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