Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility

Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001.

Bibliographic Details
Main Author: Knudsen, David Charles, 1972-
Other Authors: Roy Welsch and Kevin Amaratunga.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2014
Subjects:
Online Access:http://hdl.handle.net/1721.1/84228
Description
Summary:Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001.