Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/84228 |
| _version_ | 1811093238347464704 |
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| author | Knudsen, David Charles, 1972- |
| author2 | Roy Welsch and Kevin Amaratunga. |
| author_facet | Roy Welsch and Kevin Amaratunga. Knudsen, David Charles, 1972- |
| author_sort | Knudsen, David Charles, 1972- |
| collection | MIT |
| description | Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001. |
| first_indexed | 2024-09-23T15:42:06Z |
| format | Thesis |
| id | mit-1721.1/84228 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T15:42:06Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/842282019-04-11T11:07:49Z Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility Knudsen, David Charles, 1972- Roy Welsch and Kevin Amaratunga. Massachusetts Institute of Technology. Department of Civil and Environmental Engineering. Sloan School of Management. Massachusetts Institute of Technology. Department of Civil and Environmental Engineering. Sloan School of Management. Civil and Environmental Engineering. Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001. Includes bibliographical references (p. 71). by David Charles Knudsen. S.M. 2014-01-23T18:30:07Z 2014-01-23T18:30:07Z 2001 2001 Thesis http://hdl.handle.net/1721.1/84228 48863040 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 76 p. application/pdf Massachusetts Institute of Technology |
| spellingShingle | Sloan School of Management. Civil and Environmental Engineering. Knudsen, David Charles, 1972- Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility |
| title | Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility |
| title_full | Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility |
| title_fullStr | Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility |
| title_full_unstemmed | Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility |
| title_short | Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility |
| title_sort | application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility |
| topic | Sloan School of Management. Civil and Environmental Engineering. |
| url | http://hdl.handle.net/1721.1/84228 |
| work_keys_str_mv | AT knudsendavidcharles1972 applicationofstasticalqualitycontroltoimproveyieldsandrationalizetestinginalowvolumemanufacturingfacility |