A hardware platform to test analog-to-information conversion and non-uniform sampling

Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2013.

Bibliographic Details
Main Author: Perez, Miguel E., M. Eng. Massachusetts Institute of Technology
Other Authors: Hae-Seung Lee.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2014
Subjects:
Online Access:http://hdl.handle.net/1721.1/85482
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author Perez, Miguel E., M. Eng. Massachusetts Institute of Technology
author2 Hae-Seung Lee.
author_facet Hae-Seung Lee.
Perez, Miguel E., M. Eng. Massachusetts Institute of Technology
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spelling mit-1721.1/854822019-04-12T15:04:02Z A hardware platform to test analog-to-information conversion and non-uniform sampling Compressed sensing front end for medical applications Perez, Miguel E., M. Eng. Massachusetts Institute of Technology Hae-Seung Lee. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2013. Cataloged from PDF version of thesis. Includes bibliographical references (pages 121-123). The Nyquist-Shannon sampling theorem tells us that in order to fully recover a band-limited signal previously converted to discrete data points, said signal must have been sampled at a frequency greater than twice its bandwidth. This theorem puts a burden on circuits like ADCs, in the sense that the higher the bandwidth of a signal, the faster the ADC must be by a factor of at least 2. This in turn translates into higher power consumption. The problem can be mitigated to a certain extent by the use of zero-crossing based ADCs which consume much less power than conventional op-amp based ones, while maintaining the same performance levels. However, the burden still remains, and with the increase in the use of biologically implantable devices, the need for the utmost power efficiency is essential. This is where the theory of compressed sensing seems to offer an alternate solution. Instead of solving the problem with the brute force approach of increasing power consumption to meet performance, compressed sensing promises to increase the effective figure of merit (FOM) by exploiting certain characteristics in the signal's structure. Compressed sensing tells us, that a signal that meets certain criteria, does not need to be sampled at twice its bandwidth in order to be fully recoverable. This means that an ADC no longer has to operate at the Nyquist rate to guarantee that the signal will not be distorted and as a result its power consumption can be reduced considerably. This allows for more robust and energy efficient data acquisition circuits. This means more efficient and longer lasting implantable monitoring devices along with the ability to perform on-site data processing. by Miguel E. Perez. M. Eng. 2014-03-06T15:45:12Z 2014-03-06T15:45:12Z 2012 2013 Thesis http://hdl.handle.net/1721.1/85482 870996641 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 123 pages application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science.
Perez, Miguel E., M. Eng. Massachusetts Institute of Technology
A hardware platform to test analog-to-information conversion and non-uniform sampling
title A hardware platform to test analog-to-information conversion and non-uniform sampling
title_full A hardware platform to test analog-to-information conversion and non-uniform sampling
title_fullStr A hardware platform to test analog-to-information conversion and non-uniform sampling
title_full_unstemmed A hardware platform to test analog-to-information conversion and non-uniform sampling
title_short A hardware platform to test analog-to-information conversion and non-uniform sampling
title_sort hardware platform to test analog to information conversion and non uniform sampling
topic Electrical Engineering and Computer Science.
url http://hdl.handle.net/1721.1/85482
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