A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.
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Format: | Thesis |
Language: | eng |
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Massachusetts Institute of Technology
2005
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Online Access: | http://hdl.handle.net/1721.1/8555 |
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author | Sprunt, Alexander D. (Alexander Dalziel), 1977- |
author2 | Alexander H. Slocum. |
author_facet | Alexander H. Slocum. Sprunt, Alexander D. (Alexander Dalziel), 1977- |
author_sort | Sprunt, Alexander D. (Alexander Dalziel), 1977- |
collection | MIT |
description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001. |
first_indexed | 2024-09-23T16:05:24Z |
format | Thesis |
id | mit-1721.1/8555 |
institution | Massachusetts Institute of Technology |
language | eng |
last_indexed | 2024-09-23T16:05:24Z |
publishDate | 2005 |
publisher | Massachusetts Institute of Technology |
record_format | dspace |
spelling | mit-1721.1/85552019-04-10T17:44:32Z A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing Sprunt, Alexander D. (Alexander Dalziel), 1977- Alexander H. Slocum. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Mechanical Engineering. Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001. Includes bibliographical references (p. 103). Technology was developed to facilitate electrical contact tribology experiments on continuous media, dramatically reducing the difficulty of employing virgin material for each test. Specifically, a tester was designed to accurately reproduce semiconductor contactor operating environments while measuring contact resistance in-situ, thereby effecting the study of operating temperature, test current, cleaning method, and cleaning interval on contactor life. To manipulate the continuous media while preserving exact constraint, novel web handling machine elements were devised. Universal joints and beam type flexible couplings were employed for gimballing and castering axes, both at standard caster radii and at roller center. A kinematic edge constraint was designed. The torque transmission properties of clamped connections were alloyed to the favorable kinematics of typical pinned type connections by compliantly mounting a spherical roller bearing as a pinch roller. by Alexander D. Sprunt. S.M. 2005-08-23T21:13:49Z 2005-08-23T21:13:49Z 2001 2001 Thesis http://hdl.handle.net/1721.1/8555 49038764 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 112 p., [58] leaves of plates 12041915 bytes 12041676 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
spellingShingle | Mechanical Engineering. Sprunt, Alexander D. (Alexander Dalziel), 1977- A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing |
title | A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing |
title_full | A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing |
title_fullStr | A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing |
title_full_unstemmed | A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing |
title_short | A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing |
title_sort | machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing |
topic | Mechanical Engineering. |
url | http://hdl.handle.net/1721.1/8555 |
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