Preferential Scattering by Interfacial Charged Defects for Enhanced Thermoelectric Performance in Few-layered n-type Bi[subscript 2]Te[subscript 3]
Over the past two decades several nano-structuring methods have helped improve the figure of merit (ZT) in the state-of-the art bulk thermoelectric materials. While these methods could enhance the thermoelectric performance of p-type Bi[subscript 2]Te[subscript 3], it was frustrating to researchers...
| Auteurs principaux: | , , , , , , , |
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| Autres auteurs: | |
| Format: | Article |
| Langue: | en_US |
| Publié: |
Nature Publishing Group
2014
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| Accès en ligne: | http://hdl.handle.net/1721.1/85917 https://orcid.org/0000-0001-8492-2261 |