Integrity verification for path Oblivious-RAM
Oblivious-RAMs (ORAM) are used to hide memory access patterns. Path ORAM has gained popularity due to its efficiency and simplicity. In this paper, we propose an efficient integrity verification layer for Path ORAM, which only imposes 17% latency overhead. We also show that integrity verification is...
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Institute of Electrical and Electronics Engineers (IEEE)
2014
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Online Access: | http://hdl.handle.net/1721.1/86167 https://orcid.org/0000-0001-8253-7714 https://orcid.org/0000-0003-4317-3457 https://orcid.org/0000-0003-3437-7570 https://orcid.org/0000-0002-1224-0314 https://orcid.org/0000-0003-1467-2150 |
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author | Ren, Ling Yu, Xiangyao Devadas, Srinivas Fletcher, Christopher Wardlaw Van Dijk, Marten |
author2 | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory |
author_facet | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory Ren, Ling Yu, Xiangyao Devadas, Srinivas Fletcher, Christopher Wardlaw Van Dijk, Marten |
author_sort | Ren, Ling |
collection | MIT |
description | Oblivious-RAMs (ORAM) are used to hide memory access patterns. Path ORAM has gained popularity due to its efficiency and simplicity. In this paper, we propose an efficient integrity verification layer for Path ORAM, which only imposes 17% latency overhead. We also show that integrity verification is vital to maintaining privacy for recursive Path ORAMs under active adversaries. |
first_indexed | 2024-09-23T16:18:47Z |
format | Article |
id | mit-1721.1/86167 |
institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T16:18:47Z |
publishDate | 2014 |
publisher | Institute of Electrical and Electronics Engineers (IEEE) |
record_format | dspace |
spelling | mit-1721.1/861672022-10-02T07:38:52Z Integrity verification for path Oblivious-RAM Ren, Ling Yu, Xiangyao Devadas, Srinivas Fletcher, Christopher Wardlaw Van Dijk, Marten Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Ren, Ling Fletcher, Christopher Wardlaw Yu, Xiangyao Van Dijk, Marten Devadas, Srinivas Oblivious-RAMs (ORAM) are used to hide memory access patterns. Path ORAM has gained popularity due to its efficiency and simplicity. In this paper, we propose an efficient integrity verification layer for Path ORAM, which only imposes 17% latency overhead. We also show that integrity verification is vital to maintaining privacy for recursive Path ORAMs under active adversaries. 2014-04-14T18:45:36Z 2014-04-14T18:45:36Z 2013-09 Article http://purl.org/eprint/type/ConferencePaper 978-1-4799-1365-7 978-1-4799-1364-0 http://hdl.handle.net/1721.1/86167 Ren, Ling, Christopher W. Fletcher, Xiangyao Yu, Marten van Dijk, and Srinivas Devadas. “Integrity Verification for Path Oblivious-RAM.” 2013 IEEE High Performance Extreme Computing Conference (HPEC) (n.d.). https://orcid.org/0000-0001-8253-7714 https://orcid.org/0000-0003-4317-3457 https://orcid.org/0000-0003-3437-7570 https://orcid.org/0000-0002-1224-0314 https://orcid.org/0000-0003-1467-2150 en_US http://dx.doi.org/10.1109/HPEC.2013.6670339 Proceedings of the 2013 IEEE High Performance Extreme Computing Conference (HPEC) Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf Institute of Electrical and Electronics Engineers (IEEE) MIT web domain |
spellingShingle | Ren, Ling Yu, Xiangyao Devadas, Srinivas Fletcher, Christopher Wardlaw Van Dijk, Marten Integrity verification for path Oblivious-RAM |
title | Integrity verification for path Oblivious-RAM |
title_full | Integrity verification for path Oblivious-RAM |
title_fullStr | Integrity verification for path Oblivious-RAM |
title_full_unstemmed | Integrity verification for path Oblivious-RAM |
title_short | Integrity verification for path Oblivious-RAM |
title_sort | integrity verification for path oblivious ram |
url | http://hdl.handle.net/1721.1/86167 https://orcid.org/0000-0001-8253-7714 https://orcid.org/0000-0003-4317-3457 https://orcid.org/0000-0003-3437-7570 https://orcid.org/0000-0002-1224-0314 https://orcid.org/0000-0003-1467-2150 |
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