Design, fabrication, and testing of a scanning probe potentiometer
Thesis (S.B. and M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/86288 |
| _version_ | 1826205028380049408 |
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| author | Cooper, Emily Barbara, 1977- |
| author2 | Scott R. Manalis. |
| author_facet | Scott R. Manalis. Cooper, Emily Barbara, 1977- |
| author_sort | Cooper, Emily Barbara, 1977- |
| collection | MIT |
| description | Thesis (S.B. and M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000. |
| first_indexed | 2024-09-23T13:05:56Z |
| format | Thesis |
| id | mit-1721.1/86288 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T13:05:56Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/862882019-04-10T12:42:37Z Design, fabrication, and testing of a scanning probe potentiometer Scanning probe potentiometer Cooper, Emily Barbara, 1977- Scott R. Manalis. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (S.B. and M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000. Includes bibliographical references (leaves 43-45). by Emily Barbara Cooper. S.B.and M.Eng. 2014-04-25T20:48:00Z 2014-04-25T20:48:00Z 2000 2000 Thesis http://hdl.handle.net/1721.1/86288 46851760 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 45 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Cooper, Emily Barbara, 1977- Design, fabrication, and testing of a scanning probe potentiometer |
| title | Design, fabrication, and testing of a scanning probe potentiometer |
| title_full | Design, fabrication, and testing of a scanning probe potentiometer |
| title_fullStr | Design, fabrication, and testing of a scanning probe potentiometer |
| title_full_unstemmed | Design, fabrication, and testing of a scanning probe potentiometer |
| title_short | Design, fabrication, and testing of a scanning probe potentiometer |
| title_sort | design fabrication and testing of a scanning probe potentiometer |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/86288 |
| work_keys_str_mv | AT cooperemilybarbara1977 designfabricationandtestingofascanningprobepotentiometer AT cooperemilybarbara1977 scanningprobepotentiometer |