An expert system to detect and diagnose failures in DRAM
Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.
| Main Author: | |
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| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/86489 |
| _version_ | 1826217841210163200 |
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| author | Satish, Venkatesh, 1976- |
| author2 | Srinivas Devadas. |
| author_facet | Srinivas Devadas. Satish, Venkatesh, 1976- |
| author_sort | Satish, Venkatesh, 1976- |
| collection | MIT |
| description | Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000. |
| first_indexed | 2024-09-23T17:10:00Z |
| format | Thesis |
| id | mit-1721.1/86489 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T17:10:00Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/864892019-04-10T13:09:05Z An expert system to detect and diagnose failures in DRAM Expert system to detect and diagnose failures in dynamic randon-access memory Satish, Venkatesh, 1976- Srinivas Devadas. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000. Includes bibliographical references (leaves 63-64). by Venkatesh Satish. M.Eng. 2014-05-07T16:44:44Z 2014-05-07T16:44:44Z 2000 2000 Thesis http://hdl.handle.net/1721.1/86489 46888270 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 65 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Satish, Venkatesh, 1976- An expert system to detect and diagnose failures in DRAM |
| title | An expert system to detect and diagnose failures in DRAM |
| title_full | An expert system to detect and diagnose failures in DRAM |
| title_fullStr | An expert system to detect and diagnose failures in DRAM |
| title_full_unstemmed | An expert system to detect and diagnose failures in DRAM |
| title_short | An expert system to detect and diagnose failures in DRAM |
| title_sort | expert system to detect and diagnose failures in dram |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/86489 |
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