Characterization of optical interconnects
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/8738 |
| _version_ | 1826193223088865280 |
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| author | Sam, Shiou Lin, 1976- |
| author2 | Duane Boning and Anantha Chandrakasan. |
| author_facet | Duane Boning and Anantha Chandrakasan. Sam, Shiou Lin, 1976- |
| author_sort | Sam, Shiou Lin, 1976- |
| collection | MIT |
| description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000. |
| first_indexed | 2024-09-23T09:35:55Z |
| format | Thesis |
| id | mit-1721.1/8738 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T09:35:55Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/87382019-04-11T12:13:18Z Characterization of optical interconnects Sam, Shiou Lin, 1976- Duane Boning and Anantha Chandrakasan. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000. Includes bibliographical references (p. 72-75). Interconnect has become a major issue in deep sub-micron technology. Even with copper and low-k dielectrics, parasitic effects of interconnects will eventually impede advances in integrated electronics. One technique that has the potential to provide a paradigm shift is optics. This project evaluates the feasibility of optical interconnects for distributing data and clock signals. In adopting this scheme, variation is introduced by the detector, the waveguides, and the optoelectronic circuit, which includes device, power supply and temperature variations. We attempt to characterize the effects of the aforementioned sources of variation by designing a baseline optoelectronic circuitry and fabricating a test chip which consists of the circuitry and detectors. Simulations are also performed to supplement the effort. The results are compared with the performance of traditional metal interconnects. The feasibility of optical interconnects is found to be sensitive to the optoelectronic circuitry used. Variation effects from the devices and operating conditions have profound impact on the performance of optical interconnects since they introduce substantial skew and delay in the otherwise ideal system. by Shiou Lin Sam. S.M. 2005-08-23T14:54:03Z 2005-08-23T14:54:03Z 2000 2000 Thesis http://hdl.handle.net/1721.1/8738 48040192 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 75 p. 4404504 bytes 4404264 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Sam, Shiou Lin, 1976- Characterization of optical interconnects |
| title | Characterization of optical interconnects |
| title_full | Characterization of optical interconnects |
| title_fullStr | Characterization of optical interconnects |
| title_full_unstemmed | Characterization of optical interconnects |
| title_short | Characterization of optical interconnects |
| title_sort | characterization of optical interconnects |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/8738 |
| work_keys_str_mv | AT samshioulin1976 characterizationofopticalinterconnects |