Investigation of noise sources in scaled CMOS field-effect transistors

Investigation of noise sources in scaled CMOS field-effect transistors

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.

Bibliographic Details
Main Author:	Sepke, Todd C. (Todd Christopher), 1975-
Other Authors:	Hae-Seung Lee and Charles G. Sodini.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2014
Subjects:	Electrical Engineering and Computer Science.
Online Access:	http://hdl.handle.net/1721.1/87824

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