Image processing for precision atomic force microscopy
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2000.
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Format: | Thesis |
Language: | eng |
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Massachusetts Institute of Technology
2014
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Online Access: | http://hdl.handle.net/1721.1/88854 |
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author | Yeo, Yee, 1977- |
author2 | Kamal Youcef-Toumi. |
author_facet | Kamal Youcef-Toumi. Yeo, Yee, 1977- |
author_sort | Yeo, Yee, 1977- |
collection | MIT |
description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2000. |
first_indexed | 2024-09-23T14:34:01Z |
format | Thesis |
id | mit-1721.1/88854 |
institution | Massachusetts Institute of Technology |
language | eng |
last_indexed | 2024-09-23T14:34:01Z |
publishDate | 2014 |
publisher | Massachusetts Institute of Technology |
record_format | dspace |
spelling | mit-1721.1/888542019-04-10T15:42:37Z Image processing for precision atomic force microscopy Yeo, Yee, 1977- Kamal Youcef-Toumi. Massachusetts Institute of Technology. Department of Mechanical Engineering. Massachusetts Institute of Technology. Department of Mechanical Engineering. Mechanical Engineering. Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2000. Includes bibliographical references (leaves 72-75). by Yee Yeo. S.M. 2014-08-19T17:33:36Z 2014-08-19T17:33:36Z 2000 2000 Thesis http://hdl.handle.net/1721.1/88854 46241207 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 75 leaves application/pdf Massachusetts Institute of Technology |
spellingShingle | Mechanical Engineering. Yeo, Yee, 1977- Image processing for precision atomic force microscopy |
title | Image processing for precision atomic force microscopy |
title_full | Image processing for precision atomic force microscopy |
title_fullStr | Image processing for precision atomic force microscopy |
title_full_unstemmed | Image processing for precision atomic force microscopy |
title_short | Image processing for precision atomic force microscopy |
title_sort | image processing for precision atomic force microscopy |
topic | Mechanical Engineering. |
url | http://hdl.handle.net/1721.1/88854 |
work_keys_str_mv | AT yeoyee1977 imageprocessingforprecisionatomicforcemicroscopy |