Statistical usage models in mobile processor thermal design and testing
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2003.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/89389 |
| _version_ | 1826193724747546624 |
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| author | Evans, Thomas C. (Thomas Carl), 1971- |
| author2 | Daniel E. Whitney and Roy E. Welsch. |
| author_facet | Daniel E. Whitney and Roy E. Welsch. Evans, Thomas C. (Thomas Carl), 1971- |
| author_sort | Evans, Thomas C. (Thomas Carl), 1971- |
| collection | MIT |
| description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2003. |
| first_indexed | 2024-09-23T09:43:56Z |
| format | Thesis |
| id | mit-1721.1/89389 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T09:43:56Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/893892022-01-28T18:49:31Z Statistical usage models in mobile processor thermal design and testing Statistical usage models in mobile microprocessor thermal design and testing Evans, Thomas C. (Thomas Carl), 1971- Daniel E. Whitney and Roy E. Welsch. Leaders for Manufacturing Program. Leaders for Manufacturing Program at MIT Massachusetts Institute of Technology. Department of Mechanical Engineering Sloan School of Management Mechanical Engineering. Sloan School of Management. Leaders for Manufacturing Program. Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2003. Includes bibliographical references (p. 77). by Thomas C. Evans. S.M. 2014-09-09T17:58:25Z 2014-09-09T17:58:25Z 2003 2003 Thesis http://hdl.handle.net/1721.1/89389 53362268 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 77 p. application/pdf Massachusetts Institute of Technology |
| spellingShingle | Mechanical Engineering. Sloan School of Management. Leaders for Manufacturing Program. Evans, Thomas C. (Thomas Carl), 1971- Statistical usage models in mobile processor thermal design and testing |
| title | Statistical usage models in mobile processor thermal design and testing |
| title_full | Statistical usage models in mobile processor thermal design and testing |
| title_fullStr | Statistical usage models in mobile processor thermal design and testing |
| title_full_unstemmed | Statistical usage models in mobile processor thermal design and testing |
| title_short | Statistical usage models in mobile processor thermal design and testing |
| title_sort | statistical usage models in mobile processor thermal design and testing |
| topic | Mechanical Engineering. Sloan School of Management. Leaders for Manufacturing Program. |
| url | http://hdl.handle.net/1721.1/89389 |
| work_keys_str_mv | AT evansthomascthomascarl1971 statisticalusagemodelsinmobileprocessorthermaldesignandtesting AT evansthomascthomascarl1971 statisticalusagemodelsinmobilemicroprocessorthermaldesignandtesting |