Characterizing dielectric materials with a feedback-based model
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2014.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1721.1/91866 |
| _version_ | 1826211878749077504 |
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| author | Rybak, Michelle (Michelle A.) |
| author2 | Scott Westbrook and Luca Daniel. |
| author_facet | Scott Westbrook and Luca Daniel. Rybak, Michelle (Michelle A.) |
| author_sort | Rybak, Michelle (Michelle A.) |
| collection | MIT |
| description | Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2014. |
| first_indexed | 2024-09-23T15:12:52Z |
| format | Thesis |
| id | mit-1721.1/91866 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T15:12:52Z |
| publishDate | 2014 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/918662019-04-11T13:52:35Z Characterizing dielectric materials with a feedback-based model Rybak, Michelle (Michelle A.) Scott Westbrook and Luca Daniel. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2014. Cataloged from PDF version of thesis. Includes bibliographical references (pages 54-55). As signal frequencies continue to increase, conductor surface roughness losses of interconnects are becoming more prominent. There is currently no industry standard for separating the dielectric and conductor losses that appear in PCBs. As part of the thesis work, test vehicles composed of six different dielectric materials were fabricated with different trace widths, copper foil profiles, and oxide surface treatments. A Feedback-Based Model was used to simulate and extract the dielectric and conductor losses from measurements made with the different test vehicles. Simulation software such as MATLAB, Agilent ADS, and Polar Si9000 were utilized. Dielectric material Megtron 4 had the lowest Df of the materials of interest. The Feedback Based Model was able to fit the data well for either low frequencies and high frequencies, but not both. Further, the model was able to model the effects of changes in copper roughness well. Small variations were seen in the extracted Df associated with changes in width of the measurement traces. by Michelle Rybak. M. Eng. 2014-11-24T18:41:04Z 2014-11-24T18:41:04Z 2014 2014 Thesis http://hdl.handle.net/1721.1/91866 894354565 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 55 pages application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science. Rybak, Michelle (Michelle A.) Characterizing dielectric materials with a feedback-based model |
| title | Characterizing dielectric materials with a feedback-based model |
| title_full | Characterizing dielectric materials with a feedback-based model |
| title_fullStr | Characterizing dielectric materials with a feedback-based model |
| title_full_unstemmed | Characterizing dielectric materials with a feedback-based model |
| title_short | Characterizing dielectric materials with a feedback-based model |
| title_sort | characterizing dielectric materials with a feedback based model |
| topic | Electrical Engineering and Computer Science. |
| url | http://hdl.handle.net/1721.1/91866 |
| work_keys_str_mv | AT rybakmichellemichellea characterizingdielectricmaterialswithafeedbackbasedmodel |