Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition
Thin superconducting films form a unique platform for geometrically confined, strongly interacting electrons. They allow an inherent competition between disorder and superconductivity, which in turn enables the intriguing superconducting-to-insulating transition and is believed to facilitate the com...
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| Format: | Article |
| Language: | English |
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American Physical Society
2014
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| Online Access: | http://hdl.handle.net/1721.1/92386 https://orcid.org/0000-0002-8547-0639 https://orcid.org/0000-0001-6929-4391 https://orcid.org/0000-0003-2480-767X https://orcid.org/0000-0001-7453-9031 https://orcid.org/0000-0002-1438-7109 https://orcid.org/0000-0002-8553-6474 |
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| author | Ivry, Yachin Kim, Chung-Soo De Fazio, Domenico McCaughan, Adam N. Sunter, Kristen A. Zhao, Qingyuan Berggren, Karl K. Dane, Andrew Edward |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Ivry, Yachin Kim, Chung-Soo De Fazio, Domenico McCaughan, Adam N. Sunter, Kristen A. Zhao, Qingyuan Berggren, Karl K. Dane, Andrew Edward |
| author_sort | Ivry, Yachin |
| collection | MIT |
| description | Thin superconducting films form a unique platform for geometrically confined, strongly interacting electrons. They allow an inherent competition between disorder and superconductivity, which in turn enables the intriguing superconducting-to-insulating transition and is believed to facilitate the comprehension of high-T[subscript c] superconductivity. Furthermore, understanding thin film superconductivity is technologically essential, e.g., for photodetectors and quantum computers. Consequently, the absence of established universal relationships between critical temperature (T[subscript c]), film thickness (d), and sheet resistance (R[subscript s]) hinders both our understanding of the onset of the superconductivity and the development of miniaturized superconducting devices. We report that in thin films, superconductivity scales as dT[subscript c](R[subscript s]). We demonstrated this scaling by analyzing the data published over the past 46 years for different materials (and facilitated this database for further analysis). Moreover, we experimentally confirmed the discovered scaling for NbN films, quantified it with a power law, explored its possible origin, and demonstrated its usefulness for nanometer-length-scale superconducting film-based devices. |
| first_indexed | 2024-09-23T13:36:17Z |
| format | Article |
| id | mit-1721.1/92386 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T13:36:17Z |
| publishDate | 2014 |
| publisher | American Physical Society |
| record_format | dspace |
| spelling | mit-1721.1/923862022-10-01T15:56:50Z Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition Ivry, Yachin Kim, Chung-Soo De Fazio, Domenico McCaughan, Adam N. Sunter, Kristen A. Zhao, Qingyuan Berggren, Karl K. Dane, Andrew Edward Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Research Laboratory of Electronics Ivry, Yachin Kim, Chung-Soo Dane, Andrew Edward De Fazio, Domenico McCaughan, Adam N. Sunter, Kristen A. Zhao, Qingyuan Berggren, Karl K. Thin superconducting films form a unique platform for geometrically confined, strongly interacting electrons. They allow an inherent competition between disorder and superconductivity, which in turn enables the intriguing superconducting-to-insulating transition and is believed to facilitate the comprehension of high-T[subscript c] superconductivity. Furthermore, understanding thin film superconductivity is technologically essential, e.g., for photodetectors and quantum computers. Consequently, the absence of established universal relationships between critical temperature (T[subscript c]), film thickness (d), and sheet resistance (R[subscript s]) hinders both our understanding of the onset of the superconductivity and the development of miniaturized superconducting devices. We report that in thin films, superconductivity scales as dT[subscript c](R[subscript s]). We demonstrated this scaling by analyzing the data published over the past 46 years for different materials (and facilitated this database for further analysis). Moreover, we experimentally confirmed the discovered scaling for NbN films, quantified it with a power law, explored its possible origin, and demonstrated its usefulness for nanometer-length-scale superconducting film-based devices. United States. Dept. of Energy. Office of Basic Energy Sciences (Award DE-SC0001088) United States. Intelligence Advanced Research Projects Activity (Award FA8650-11-C-7105) National Science Foundation (U.S.). Integrative Graduate Education and Research Traineeship (Interdisciplinary Quantum Information Science and Engineering Award 0801525) United States. Office of Naval Research (Contract N00014-13-1-0074) 2014-12-18T18:45:56Z 2014-12-18T18:45:56Z 2014-12 2014-09 2014-12-15T23:00:04Z Article http://purl.org/eprint/type/JournalArticle 1098-0121 1550-235X http://hdl.handle.net/1721.1/92386 Ivry, Yachin, et al. "Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition." Phys. Rev. B 90, 214515 (December 2014) https://orcid.org/0000-0002-8547-0639 https://orcid.org/0000-0001-6929-4391 https://orcid.org/0000-0003-2480-767X https://orcid.org/0000-0001-7453-9031 https://orcid.org/0000-0002-1438-7109 https://orcid.org/0000-0002-8553-6474 en http://dx.doi.org/10.1103/PhysRevB.90.214515 Physical Review B Creative Commons Attribution http://creativecommons.org/licenses/by/3.0 authors application/pdf American Physical Society American Physical Society |
| spellingShingle | Ivry, Yachin Kim, Chung-Soo De Fazio, Domenico McCaughan, Adam N. Sunter, Kristen A. Zhao, Qingyuan Berggren, Karl K. Dane, Andrew Edward Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition |
| title | Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition |
| title_full | Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition |
| title_fullStr | Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition |
| title_full_unstemmed | Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition |
| title_short | Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition |
| title_sort | universal scaling of the critical temperature for thin films near the superconducting to insulating transition |
| url | http://hdl.handle.net/1721.1/92386 https://orcid.org/0000-0002-8547-0639 https://orcid.org/0000-0001-6929-4391 https://orcid.org/0000-0003-2480-767X https://orcid.org/0000-0001-7453-9031 https://orcid.org/0000-0002-1438-7109 https://orcid.org/0000-0002-8553-6474 |
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