X-ray response of silicon surface barrier diodes at 8 and 17.5 keV: evidence that the x-ray sensitive depth is not generally the depletion depth
| Main Authors: | , |
|---|---|
| Published: |
MIT Plasma Science and Fusion Center
2015
|
| Online Access: | http://hdl.handle.net/1721.1/94978 |
| _version_ | 1826212906164813824 |
|---|---|
| author | Wenzel, K.W. Petrasso, R.D. |
| author_facet | Wenzel, K.W. Petrasso, R.D. |
| author_sort | Wenzel, K.W. |
| collection | MIT |
| first_indexed | 2024-09-23T15:40:01Z |
| id | mit-1721.1/94978 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T15:40:01Z |
| publishDate | 2015 |
| publisher | MIT Plasma Science and Fusion Center |
| record_format | dspace |
| spelling | mit-1721.1/949782019-04-10T17:36:38Z X-ray response of silicon surface barrier diodes at 8 and 17.5 keV: evidence that the x-ray sensitive depth is not generally the depletion depth Wenzel, K.W. Petrasso, R.D. 2015-02-19T19:29:23Z 2015-02-19T19:29:23Z 1988-01-01 88ja003 http://hdl.handle.net/1721.1/94978 application/pdf MIT Plasma Science and Fusion Center |
| spellingShingle | Wenzel, K.W. Petrasso, R.D. X-ray response of silicon surface barrier diodes at 8 and 17.5 keV: evidence that the x-ray sensitive depth is not generally the depletion depth |
| title | X-ray response of silicon surface barrier diodes at 8 and 17.5 keV: evidence that the x-ray sensitive depth is not generally the depletion depth |
| title_full | X-ray response of silicon surface barrier diodes at 8 and 17.5 keV: evidence that the x-ray sensitive depth is not generally the depletion depth |
| title_fullStr | X-ray response of silicon surface barrier diodes at 8 and 17.5 keV: evidence that the x-ray sensitive depth is not generally the depletion depth |
| title_full_unstemmed | X-ray response of silicon surface barrier diodes at 8 and 17.5 keV: evidence that the x-ray sensitive depth is not generally the depletion depth |
| title_short | X-ray response of silicon surface barrier diodes at 8 and 17.5 keV: evidence that the x-ray sensitive depth is not generally the depletion depth |
| title_sort | x ray response of silicon surface barrier diodes at 8 and 17 5 kev evidence that the x ray sensitive depth is not generally the depletion depth |
| url | http://hdl.handle.net/1721.1/94978 |
| work_keys_str_mv | AT wenzelkw xrayresponseofsiliconsurfacebarrierdiodesat8and175kevevidencethatthexraysensitivedepthisnotgenerallythedepletiondepth AT petrassord xrayresponseofsiliconsurfacebarrierdiodesat8and175kevevidencethatthexraysensitivedepthisnotgenerallythedepletiondepth |