A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications
A power-scalable SAR ADC for sensor applications is presented. The ADC features a reconfigurable 5-to-10-bit DAC whose power scales exponentially with resolution. At low resolutions where noise and linearity requirements are reduced, supply voltage scaling is leveraged to further reduce the energy-p...
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Institute of Electrical and Electronics Engineers (IEEE)
2015
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Online Access: | http://hdl.handle.net/1721.1/95486 https://orcid.org/0000-0002-5977-2748 |
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author | Yip, Marcus Chandrakasan, Anantha P. |
author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Yip, Marcus Chandrakasan, Anantha P. |
author_sort | Yip, Marcus |
collection | MIT |
description | A power-scalable SAR ADC for sensor applications is presented. The ADC features a reconfigurable 5-to-10-bit DAC whose power scales exponentially with resolution. At low resolutions where noise and linearity requirements are reduced, supply voltage scaling is leveraged to further reduce the energy-per-conversion. The ADC operates up to 2 MS/s at 1 V and 5 kS/s at 0.4 V, and its power scales linearly with sample rate down to leakage levels of 53 nW at 1 V and 4 nW at 0.4 V. Leakage power-gating during a SLEEP mode in between conversions reduces total power by up to 14% at sample rates below 1 kS/s. Prototyped in a low-power 65 nm CMOS process, the ADC in 10-bit mode achieves an INL and DNL of 0.57 LSB and 0.58 LSB respectively at 0.6 V, and the Nyquist SNDR and SFDR are 55 dB and 69 dB respectively at 0.55 V and 20 kS/s. The ADC achieves an optimal FOM of 22.4 fJ/conversion-step at 0.55 V in 10-bit mode. The combined techniques of DAC resolution and voltage scaling maximize efficiency at low resolutions, resulting in an FOM that increases by only 7x over the 5-bit scaling range, improving upon a 32x degradation that would otherwise arise from truncation of bits from an ADC of fixed resolution and voltage. |
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id | mit-1721.1/95486 |
institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T10:53:35Z |
publishDate | 2015 |
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spelling | mit-1721.1/954862022-09-27T15:46:30Z A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications Yip, Marcus Chandrakasan, Anantha P. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Microsystems Technology Laboratories Chandrakasan, Anantha P. Yip, Marcus Chandrakasan, Anantha P. A power-scalable SAR ADC for sensor applications is presented. The ADC features a reconfigurable 5-to-10-bit DAC whose power scales exponentially with resolution. At low resolutions where noise and linearity requirements are reduced, supply voltage scaling is leveraged to further reduce the energy-per-conversion. The ADC operates up to 2 MS/s at 1 V and 5 kS/s at 0.4 V, and its power scales linearly with sample rate down to leakage levels of 53 nW at 1 V and 4 nW at 0.4 V. Leakage power-gating during a SLEEP mode in between conversions reduces total power by up to 14% at sample rates below 1 kS/s. Prototyped in a low-power 65 nm CMOS process, the ADC in 10-bit mode achieves an INL and DNL of 0.57 LSB and 0.58 LSB respectively at 0.6 V, and the Nyquist SNDR and SFDR are 55 dB and 69 dB respectively at 0.55 V and 20 kS/s. The ADC achieves an optimal FOM of 22.4 fJ/conversion-step at 0.55 V in 10-bit mode. The combined techniques of DAC resolution and voltage scaling maximize efficiency at low resolutions, resulting in an FOM that increases by only 7x over the 5-bit scaling range, improving upon a 32x degradation that would otherwise arise from truncation of bits from an ADC of fixed resolution and voltage. United States. Defense Advanced Research Projects Agency Natural Sciences and Engineering Research Council of Canada 2015-02-24T19:55:49Z 2015-02-24T19:55:49Z 2013-04 2012-12 Article http://purl.org/eprint/type/JournalArticle 0018-9200 1558-173X http://hdl.handle.net/1721.1/95486 Yip, Marcus, and A. P. Chandrakasan. “A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications.” IEEE Journal of Solid-State Circuits 48, no. 6 (June 2013): 1453–1464. https://orcid.org/0000-0002-5977-2748 en_US http://dx.doi.org/10.1109/JSSC.2013.2254551 IEEE Journal of Solid-State Circuits Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf Institute of Electrical and Electronics Engineers (IEEE) Chandrakasan |
spellingShingle | Yip, Marcus Chandrakasan, Anantha P. A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications |
title | A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications |
title_full | A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications |
title_fullStr | A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications |
title_full_unstemmed | A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications |
title_short | A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications |
title_sort | resolution reconfigurable 5 to 10 bit 0 4 to 1 v power scalable sar adc for sensor applications |
url | http://hdl.handle.net/1721.1/95486 https://orcid.org/0000-0002-5977-2748 |
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