Double resonance Raman modes in monolayer and few-layer MoTe[subscript 2]

We study the second-order Raman process of mono- and few-layer MoTe[subscript 2], by combining ab initio density functional perturbation calculations with experimental Raman spectroscopy using 532, 633, and 785 nm excitation lasers. The calculated electronic band structure and the density of states...

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Main Authors: Guo, Huaihong, Yang, Teng, Yamamoto, Mahito, Zhou, Lin, Ishikawa, Ryo, Ueno, Keiji, Tsukagoshi, Kazuhito, Zhang, Zhidong, Saito, Riichiro, Dresselhaus, Mildred
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:English
Published: American Physical Society 2015
Online Access:http://hdl.handle.net/1721.1/96972
https://orcid.org/0000-0001-8492-2261
https://orcid.org/0000-0001-8749-7408
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author Guo, Huaihong
Yang, Teng
Yamamoto, Mahito
Zhou, Lin
Ishikawa, Ryo
Ueno, Keiji
Tsukagoshi, Kazuhito
Zhang, Zhidong
Saito, Riichiro
Dresselhaus, Mildred
author2 Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
author_facet Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Guo, Huaihong
Yang, Teng
Yamamoto, Mahito
Zhou, Lin
Ishikawa, Ryo
Ueno, Keiji
Tsukagoshi, Kazuhito
Zhang, Zhidong
Saito, Riichiro
Dresselhaus, Mildred
author_sort Guo, Huaihong
collection MIT
description We study the second-order Raman process of mono- and few-layer MoTe[subscript 2], by combining ab initio density functional perturbation calculations with experimental Raman spectroscopy using 532, 633, and 785 nm excitation lasers. The calculated electronic band structure and the density of states show that the resonance Raman process occurs at the M point in the Brillouin zone, where a strong optical absorption occurs due to a logarithmic Van Hove singularity of the electronic density of states. The double resonance Raman process with intervalley electron-phonon coupling connects two of the three inequivalent M points in the Brillouin zone, giving rise to second-order Raman peaks due to the M-point phonons. The calculated vibrational frequencies of the second-order Raman spectra agree with the observed laser-energy-dependent Raman shifts in the experiment.
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spelling mit-1721.1/969722022-10-02T03:54:32Z Double resonance Raman modes in monolayer and few-layer MoTe[subscript 2] Guo, Huaihong Yang, Teng Yamamoto, Mahito Zhou, Lin Ishikawa, Ryo Ueno, Keiji Tsukagoshi, Kazuhito Zhang, Zhidong Saito, Riichiro Dresselhaus, Mildred Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Department of Physics Massachusetts Institute of Technology. Research Laboratory of Electronics Zhou, Lin Dresselhaus, Mildred We study the second-order Raman process of mono- and few-layer MoTe[subscript 2], by combining ab initio density functional perturbation calculations with experimental Raman spectroscopy using 532, 633, and 785 nm excitation lasers. The calculated electronic band structure and the density of states show that the resonance Raman process occurs at the M point in the Brillouin zone, where a strong optical absorption occurs due to a logarithmic Van Hove singularity of the electronic density of states. The double resonance Raman process with intervalley electron-phonon coupling connects two of the three inequivalent M points in the Brillouin zone, giving rise to second-order Raman peaks due to the M-point phonons. The calculated vibrational frequencies of the second-order Raman spectra agree with the observed laser-energy-dependent Raman shifts in the experiment. National Science Foundation (U.S.). Division of Materials Research (Grant 1004147) 2015-05-13T12:26:16Z 2015-05-13T12:26:16Z 2015-05 2015-03 2015-05-12T22:00:03Z Article http://purl.org/eprint/type/JournalArticle 1098-0121 1550-235X http://hdl.handle.net/1721.1/96972 Guo, Huaihong, Teng Yang, Mahito Yamamoto, Lin Zhou, Ryo Ishikawa, Keiji Ueno, Kazuhito Tsukagoshi, Zhidong Zhang, Mildred S. Dresselhaus, and Riichiro Saito. “Double Resonance Raman Modes in Monolayer and Few-Layer MoTe[subscript 2].” Phys. Rev. B 91, no. 20 (May 2015). © 2015 American Physical Society https://orcid.org/0000-0001-8492-2261 https://orcid.org/0000-0001-8749-7408 en http://dx.doi.org/10.1103/PhysRevB.91.205415 Physical Review B Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. American Physical Society application/pdf American Physical Society American Physical Society
spellingShingle Guo, Huaihong
Yang, Teng
Yamamoto, Mahito
Zhou, Lin
Ishikawa, Ryo
Ueno, Keiji
Tsukagoshi, Kazuhito
Zhang, Zhidong
Saito, Riichiro
Dresselhaus, Mildred
Double resonance Raman modes in monolayer and few-layer MoTe[subscript 2]
title Double resonance Raman modes in monolayer and few-layer MoTe[subscript 2]
title_full Double resonance Raman modes in monolayer and few-layer MoTe[subscript 2]
title_fullStr Double resonance Raman modes in monolayer and few-layer MoTe[subscript 2]
title_full_unstemmed Double resonance Raman modes in monolayer and few-layer MoTe[subscript 2]
title_short Double resonance Raman modes in monolayer and few-layer MoTe[subscript 2]
title_sort double resonance raman modes in monolayer and few layer mote subscript 2
url http://hdl.handle.net/1721.1/96972
https://orcid.org/0000-0001-8492-2261
https://orcid.org/0000-0001-8749-7408
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