Bayesian inference of substrate properties from film behavior
We demonstrate that by observing the behavior of a film deposited on a substrate, certain features of the substrate may be inferred with quantified uncertainty using Bayesian methods. We carry out this demonstration on an illustrative film/substrate model where the substrate is a Gaussian random fie...
| Main Authors: | , , |
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| Format: | Article |
| Language: | en_US |
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IOP Publishing
2015
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| Online Access: | http://hdl.handle.net/1721.1/97567 https://orcid.org/0000-0001-5321-3489 https://orcid.org/0000-0001-8242-3290 https://orcid.org/0000-0003-3949-0441 |
| _version_ | 1826197297774460928 |
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| author | Aggarwal, Raghav Demkowicz, Michael J. Marzouk, Youssef M. |
| author2 | Massachusetts Institute of Technology. Department of Aeronautics and Astronautics |
| author_facet | Massachusetts Institute of Technology. Department of Aeronautics and Astronautics Aggarwal, Raghav Demkowicz, Michael J. Marzouk, Youssef M. |
| author_sort | Aggarwal, Raghav |
| collection | MIT |
| description | We demonstrate that by observing the behavior of a film deposited on a substrate, certain features of the substrate may be inferred with quantified uncertainty using Bayesian methods. We carry out this demonstration on an illustrative film/substrate model where the substrate is a Gaussian random field and the film is a two-component mixture that obeys the Cahn–Hilliard equation. We construct a stochastic reduced order model to describe the film/substrate interaction and use it to infer substrate properties from film behavior. This quantitative inference strategy may be adapted to other film/substrate systems. |
| first_indexed | 2024-09-23T10:45:33Z |
| format | Article |
| id | mit-1721.1/97567 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T10:45:33Z |
| publishDate | 2015 |
| publisher | IOP Publishing |
| record_format | dspace |
| spelling | mit-1721.1/975672022-09-30T22:47:17Z Bayesian inference of substrate properties from film behavior Aggarwal, Raghav Demkowicz, Michael J. Marzouk, Youssef M. Massachusetts Institute of Technology. Department of Aeronautics and Astronautics Massachusetts Institute of Technology. Department of Materials Science and Engineering Massachusetts Institute of Technology. Department of Mechanical Engineering Aggarwal, Raghav Aggarwal, Raghav Demkowicz, Michael J. Marzouk, Youssef M. We demonstrate that by observing the behavior of a film deposited on a substrate, certain features of the substrate may be inferred with quantified uncertainty using Bayesian methods. We carry out this demonstration on an illustrative film/substrate model where the substrate is a Gaussian random field and the film is a two-component mixture that obeys the Cahn–Hilliard equation. We construct a stochastic reduced order model to describe the film/substrate interaction and use it to infer substrate properties from film behavior. This quantitative inference strategy may be adapted to other film/substrate systems. United States. Dept. of Energy. Office of Basic Energy Sciences (Award DE-SC0008926) 2015-06-29T18:18:35Z 2015-06-29T18:18:35Z 2014-12 2014-05 Article http://purl.org/eprint/type/JournalArticle 0965-0393 1361-651X http://hdl.handle.net/1721.1/97567 Aggarwal, R, M J Demkowicz, and Y M Marzouk. “Bayesian Inference of Substrate Properties from Film Behavior.” Modelling Simul. Mater. Sci. Eng. 23, no. 1 (December 19, 2014): 015009. https://orcid.org/0000-0001-5321-3489 https://orcid.org/0000-0001-8242-3290 https://orcid.org/0000-0003-3949-0441 en_US http://dx.doi.org/10.1088/0965-0393/23/1/015009 Modelling and Simulation in Materials Science and Engineering Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf IOP Publishing R. Aggarwal (grad student) via Barbara Williams |
| spellingShingle | Aggarwal, Raghav Demkowicz, Michael J. Marzouk, Youssef M. Bayesian inference of substrate properties from film behavior |
| title | Bayesian inference of substrate properties from film behavior |
| title_full | Bayesian inference of substrate properties from film behavior |
| title_fullStr | Bayesian inference of substrate properties from film behavior |
| title_full_unstemmed | Bayesian inference of substrate properties from film behavior |
| title_short | Bayesian inference of substrate properties from film behavior |
| title_sort | bayesian inference of substrate properties from film behavior |
| url | http://hdl.handle.net/1721.1/97567 https://orcid.org/0000-0001-5321-3489 https://orcid.org/0000-0001-8242-3290 https://orcid.org/0000-0003-3949-0441 |
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