Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements
The potent anthropogenic perfluorocarbon greenhouse gases tetrafluoromethane (CF[subscript 4]) and hexafluoroethane (C[subscript 2]F[subscript 6]) are emitted to the atmosphere mainly by the aluminum and semiconductor industries. Global emissions of these perfluorocarbons (PFCs) calculated from atmo...
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| Format: | Article |
| Language: | en_US |
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Wiley Blackwell
2015
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| Online Access: | http://hdl.handle.net/1721.1/99154 https://orcid.org/0000-0001-5925-3801 |
| _version_ | 1826191024023666688 |
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| author | Kim, Jooil Fraser, Paul J. Li, Shanlan Ganesan, Anita L. Krummel, P. B. Steele, L. Paul Park, Sunyoung Kim, Seung-Kyu Park, Mi-Kyung Arnold, Tim Harth, Christina M. Salameh, Peter K. Prinn, Ronald G. Weiss, Ray F. Kim, Kyung-Ryul Muhle, Jens |
| author2 | Massachusetts Institute of Technology. Center for Global Change Science |
| author_facet | Massachusetts Institute of Technology. Center for Global Change Science Kim, Jooil Fraser, Paul J. Li, Shanlan Ganesan, Anita L. Krummel, P. B. Steele, L. Paul Park, Sunyoung Kim, Seung-Kyu Park, Mi-Kyung Arnold, Tim Harth, Christina M. Salameh, Peter K. Prinn, Ronald G. Weiss, Ray F. Kim, Kyung-Ryul Muhle, Jens |
| author_sort | Kim, Jooil |
| collection | MIT |
| description | The potent anthropogenic perfluorocarbon greenhouse gases tetrafluoromethane (CF[subscript 4]) and hexafluoroethane (C[subscript 2]F[subscript 6]) are emitted to the atmosphere mainly by the aluminum and semiconductor industries. Global emissions of these perfluorocarbons (PFCs) calculated from atmospheric measurements are significantly greater than expected from reported national and industry-based emission inventories. In this study, in situ measurements of the two PFCs in the Advanced Global Atmospheric Gases Experiment network are used to show that their emission ratio varies according to the relative regional presence of these two industries, providing an industry-specific emission “signature” to apportion the observed emissions. Our results suggest that underestimated emissions from the global semiconductor industry during 1990–2010, as well as from China's aluminum industry after 2002, account for the observed differences between emissions based on atmospheric measurements and on inventories. These differences are significant despite the large uncertainties in emissions based on the methodologies used by these industries. |
| first_indexed | 2024-09-23T08:48:55Z |
| format | Article |
| id | mit-1721.1/99154 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T08:48:55Z |
| publishDate | 2015 |
| publisher | Wiley Blackwell |
| record_format | dspace |
| spelling | mit-1721.1/991542022-09-30T11:26:52Z Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements Kim, Jooil Fraser, Paul J. Li, Shanlan Ganesan, Anita L. Krummel, P. B. Steele, L. Paul Park, Sunyoung Kim, Seung-Kyu Park, Mi-Kyung Arnold, Tim Harth, Christina M. Salameh, Peter K. Prinn, Ronald G. Weiss, Ray F. Kim, Kyung-Ryul Muhle, Jens Massachusetts Institute of Technology. Center for Global Change Science Prinn, Ronald G. Ganesan, Anita L. Prinn, Ronald G. The potent anthropogenic perfluorocarbon greenhouse gases tetrafluoromethane (CF[subscript 4]) and hexafluoroethane (C[subscript 2]F[subscript 6]) are emitted to the atmosphere mainly by the aluminum and semiconductor industries. Global emissions of these perfluorocarbons (PFCs) calculated from atmospheric measurements are significantly greater than expected from reported national and industry-based emission inventories. In this study, in situ measurements of the two PFCs in the Advanced Global Atmospheric Gases Experiment network are used to show that their emission ratio varies according to the relative regional presence of these two industries, providing an industry-specific emission “signature” to apportion the observed emissions. Our results suggest that underestimated emissions from the global semiconductor industry during 1990–2010, as well as from China's aluminum industry after 2002, account for the observed differences between emissions based on atmospheric measurements and on inventories. These differences are significant despite the large uncertainties in emissions based on the methodologies used by these industries. United States. National Aeronautics and Space Administration (Upper Atmospheric Research Program Grant NNX11AF17G) 2015-10-06T16:56:51Z 2015-10-06T16:56:51Z 2014-07 2014-03 Article http://purl.org/eprint/type/JournalArticle 00948276 http://hdl.handle.net/1721.1/99154 Kim, Jooil, Paul J. Fraser, Shanlan Li, Jens Mühle, Anita L. Ganesan, Paul B. Krummel, L. Paul Steele, et al. “Quantifying Aluminum and Semiconductor Industry Perfluorocarbon Emissions from Atmospheric Measurements.” Geophysical Research Letters (July 2014): n/a–n/a. © 2014 American Geophysical Union https://orcid.org/0000-0001-5925-3801 en_US http://dx.doi.org/10.1002/2014GL059783 Geophysical Research Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Wiley Blackwell Prof. Prinn via Chris Sherratt |
| spellingShingle | Kim, Jooil Fraser, Paul J. Li, Shanlan Ganesan, Anita L. Krummel, P. B. Steele, L. Paul Park, Sunyoung Kim, Seung-Kyu Park, Mi-Kyung Arnold, Tim Harth, Christina M. Salameh, Peter K. Prinn, Ronald G. Weiss, Ray F. Kim, Kyung-Ryul Muhle, Jens Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements |
| title | Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements |
| title_full | Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements |
| title_fullStr | Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements |
| title_full_unstemmed | Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements |
| title_short | Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements |
| title_sort | quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements |
| url | http://hdl.handle.net/1721.1/99154 https://orcid.org/0000-0001-5925-3801 |
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