Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis

Excess noise converted from the optical relative intensity noise (RIN) has limited the noise performance in the microwave signal synthesis application for mode-locked lasers. In this paper, a method for detailed characterization of the excess noise conversion from the optical RIN to the electrical p...

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Main Authors: Wu, Kan, Shum, Perry Ping, Aditya, Sheel, Ouyang, Chunmei, Wong, Jia Haur, Lam, Huy Quoc, Lee, Kenneth Eng Kian
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/100211
http://hdl.handle.net/10220/17641
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author Wu, Kan
Shum, Perry Ping
Aditya, Sheel
Ouyang, Chunmei
Wong, Jia Haur
Lam, Huy Quoc
Lee, Kenneth Eng Kian
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Wu, Kan
Shum, Perry Ping
Aditya, Sheel
Ouyang, Chunmei
Wong, Jia Haur
Lam, Huy Quoc
Lee, Kenneth Eng Kian
author_sort Wu, Kan
collection NTU
description Excess noise converted from the optical relative intensity noise (RIN) has limited the noise performance in the microwave signal synthesis application for mode-locked lasers. In this paper, a method for detailed characterization of the excess noise conversion from the optical RIN to the electrical pulse width jitter (PWJ), electrical relative amplitude noise (RAN) and electrical phase noise in the photodetection of mode-locked lasers is proposed. With the measured noise conversion ratios, one can predict the electrical RAN and phase noise power spectral densities under different input optical powers. The effect of the pulse width and peak power of the incident optical pulses and the effect of the saturation power of the photodetectors are also investigated. The results are used to suggest guidelines for achieving low-noise photodetection for microwave signal synthesis application.
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spelling ntu-10356/1002112020-03-07T14:02:43Z Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis Wu, Kan Shum, Perry Ping Aditya, Sheel Ouyang, Chunmei Wong, Jia Haur Lam, Huy Quoc Lee, Kenneth Eng Kian School of Electrical and Electronic Engineering DRNTU::Science::Physics::Optics and light Excess noise converted from the optical relative intensity noise (RIN) has limited the noise performance in the microwave signal synthesis application for mode-locked lasers. In this paper, a method for detailed characterization of the excess noise conversion from the optical RIN to the electrical pulse width jitter (PWJ), electrical relative amplitude noise (RAN) and electrical phase noise in the photodetection of mode-locked lasers is proposed. With the measured noise conversion ratios, one can predict the electrical RAN and phase noise power spectral densities under different input optical powers. The effect of the pulse width and peak power of the incident optical pulses and the effect of the saturation power of the photodetectors are also investigated. The results are used to suggest guidelines for achieving low-noise photodetection for microwave signal synthesis application. Accepted version 2013-11-15T01:42:29Z 2019-12-06T20:18:36Z 2013-11-15T01:42:29Z 2019-12-06T20:18:36Z 2011 2011 Journal Article Wu, K., Shum, P. P., Aditya, S., Ouyang, C., Wong, J. H., Lam, H. Q., & Lee, K. E. K. (2011). Characterization of the Excess Noise Conversion from Optical Relative Intensity Noise in the Photodetection of Mode-locked Lasers for Microwave Signal Synthesis. Journal of Lightwave Technology, 29(24), 3622-3631. 0733-8724 https://hdl.handle.net/10356/100211 http://hdl.handle.net/10220/17641 10.1109/JLT.2011.2173464 en Journal of lightwave technology © 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/JLT.2011.2173464]. 10 p. application/pdf
spellingShingle DRNTU::Science::Physics::Optics and light
Wu, Kan
Shum, Perry Ping
Aditya, Sheel
Ouyang, Chunmei
Wong, Jia Haur
Lam, Huy Quoc
Lee, Kenneth Eng Kian
Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis
title Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis
title_full Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis
title_fullStr Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis
title_full_unstemmed Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis
title_short Characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode-locked lasers for microwave signal synthesis
title_sort characterization of the excess noise conversion from optical relative intensity noise in the photodetection of mode locked lasers for microwave signal synthesis
topic DRNTU::Science::Physics::Optics and light
url https://hdl.handle.net/10356/100211
http://hdl.handle.net/10220/17641
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