Analysis and reduction of mismatch in silicon neurons
In this paper, we describe a methodical approach for reducing errors due to mismatch in neuron circuits. We chose the neuron's current-frequency (f-i) curve as the desired output and use a sensitivity analysis to determine which transistors contribute most significantly to its variation. This a...
Main Authors: | Shuo, Sun, Basu, Arindam |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Conference Paper |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/100795 http://hdl.handle.net/10220/18170 |
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