Review of single image signal-to-noise ratio estimation for SEM image
Scanning electron microscope (SEM) image signal-to-noise ratio (SNR) depends on the beam current, the materials present in the specimen, and the specimen topography. It is desirable to quantify the SNR in SEM images, as it is a parameter, along with spatial resolution, that quantifies the image qual...
| 主要な著者: | , , |
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| その他の著者: | |
| フォーマット: | Journal Article |
| 言語: | English |
| 出版事項: |
2014
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| 主題: | |
| オンライン･アクセス: | https://hdl.handle.net/10356/101179 http://hdl.handle.net/10220/18594 |