Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy
In this work, we report a mapping of charge transport in silicon nanocrystals (nc-Si) embedded in SiO2 dielectric films with electrostatic force microscopy. The charge diffusion from chargednc-Si to neighboring uncharged nc-Si in the SiO2 matrix is found to be the dominant mechanism for the decay of...
| Main Authors: | , , , , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2010
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/101362 http://hdl.handle.net/10220/6414 |
| _version_ | 1811687321399984128 |
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| author | Lau, Hon Wu Ng, Chi Yung Liu, Yang Tse, Man Siu Lim, Vanissa Sei Wei Tan, Ooi Kiang Chen, Tupei |
| author2 | School of Electrical and Electronic Engineering |
| author_facet | School of Electrical and Electronic Engineering Lau, Hon Wu Ng, Chi Yung Liu, Yang Tse, Man Siu Lim, Vanissa Sei Wei Tan, Ooi Kiang Chen, Tupei |
| author_sort | Lau, Hon Wu |
| collection | NTU |
| description | In this work, we report a mapping of charge transport in silicon nanocrystals (nc-Si) embedded in SiO2 dielectric films with electrostatic force microscopy. The charge diffusion from chargednc-Si to neighboring uncharged nc-Si in the SiO2 matrix is found to be the dominant mechanism for the decay of the trapped charge in the nc-Si. The trapped charge and the charge decay have been determined quantitatively from the electrical force measurement. An increase in the area of the charge cloud due to the charge diffusion has been observed clearly. In addition, the blockage and acceleration of charge diffusion by the neighboring charges with the same and opposite charge signs (i.e., positive or negative), respectively, have been observed. |
| first_indexed | 2024-10-01T05:14:27Z |
| format | Journal Article |
| id | ntu-10356/101362 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:14:27Z |
| publishDate | 2010 |
| record_format | dspace |
| spelling | ntu-10356/1013622020-03-07T14:02:47Z Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy Lau, Hon Wu Ng, Chi Yung Liu, Yang Tse, Man Siu Lim, Vanissa Sei Wei Tan, Ooi Kiang Chen, Tupei School of Electrical and Electronic Engineering A*STAR Institute of Microelectronics DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics In this work, we report a mapping of charge transport in silicon nanocrystals (nc-Si) embedded in SiO2 dielectric films with electrostatic force microscopy. The charge diffusion from chargednc-Si to neighboring uncharged nc-Si in the SiO2 matrix is found to be the dominant mechanism for the decay of the trapped charge in the nc-Si. The trapped charge and the charge decay have been determined quantitatively from the electrical force measurement. An increase in the area of the charge cloud due to the charge diffusion has been observed clearly. In addition, the blockage and acceleration of charge diffusion by the neighboring charges with the same and opposite charge signs (i.e., positive or negative), respectively, have been observed. Published version 2010-09-07T03:01:28Z 2019-12-06T20:37:13Z 2010-09-07T03:01:28Z 2019-12-06T20:37:13Z 2004 2004 Journal Article Lau, H. W., Ng, C. Y., Liu, Y., Tse, M. S., Lim, V. S. W., Tan, O. K., et al. (2004). Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy. Applied physics letters, 85(14), 2941-2943. 0003-6951 https://hdl.handle.net/10356/101362 http://hdl.handle.net/10220/6414 10.1063/1.1801675 en Applied physics letters Applied Physics Letters © copyright 2004 American Institute of Physics. The journal's website is located at http://apl.aip.org/applab/v85/i14/p2941_s1?isAuthorized=no 3 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics Lau, Hon Wu Ng, Chi Yung Liu, Yang Tse, Man Siu Lim, Vanissa Sei Wei Tan, Ooi Kiang Chen, Tupei Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy |
| title | Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy |
| title_full | Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy |
| title_fullStr | Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy |
| title_full_unstemmed | Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy |
| title_short | Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy |
| title_sort | visualizing charge transport in silicon nanocrystals embedded in sio2 films with electrostatic force microscopy |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics |
| url | https://hdl.handle.net/10356/101362 http://hdl.handle.net/10220/6414 |
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