A review of interferometric techniques with possible improvement in pattern resolution using near-field patterning
In this paper, we will be initially doing review on the advancement of interference lithography (IL) which is a wellestablished technique for its facile, efficient, and economical approach to achieve large-scale patterning in a wide variety of substrates at sub-wavelength resolution. Following this,...
Main Authors: | Pae, J. Y., Murukeshan, Vadakke Matham |
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Other Authors: | Asundi, Anand K. |
Format: | Conference Paper |
Language: | English |
Published: |
2018
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/102552 http://hdl.handle.net/10220/47259 |
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