Ultrahigh sensitivity refractive index sensor based on optical microfiber

We demonstrate a nonadiabatic microfiber sensor with a taper diameter of few micrometers. The modal interference caused by the abrupt taper results in a sinusoidal spectral response. The wavelength shift arising because of the changes in the external refractive index is found to be significant, achi...

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Main Authors: Ji, Wen Bin, Liu, Huan Huan, Tjin, Swee Chuan, Chow, Kin Kee, Lim, Anthony
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/102804
http://hdl.handle.net/10220/16421
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author Ji, Wen Bin
Liu, Huan Huan
Tjin, Swee Chuan
Chow, Kin Kee
Lim, Anthony
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Ji, Wen Bin
Liu, Huan Huan
Tjin, Swee Chuan
Chow, Kin Kee
Lim, Anthony
author_sort Ji, Wen Bin
collection NTU
description We demonstrate a nonadiabatic microfiber sensor with a taper diameter of few micrometers. The modal interference caused by the abrupt taper results in a sinusoidal spectral response. The wavelength shift arising because of the changes in the external refractive index is found to be significant, achieving a maximum sensitivity of 18681.82 nm/RIU. The measured results show good agreement with the theoretical predictions. The high sensitivity and the simplicity offer the sensor the potential for many real applications.
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spelling ntu-10356/1028042020-03-07T14:00:35Z Ultrahigh sensitivity refractive index sensor based on optical microfiber Ji, Wen Bin Liu, Huan Huan Tjin, Swee Chuan Chow, Kin Kee Lim, Anthony School of Electrical and Electronic Engineering Photonics Research Centre DRNTU::Engineering::Electrical and electronic engineering We demonstrate a nonadiabatic microfiber sensor with a taper diameter of few micrometers. The modal interference caused by the abrupt taper results in a sinusoidal spectral response. The wavelength shift arising because of the changes in the external refractive index is found to be significant, achieving a maximum sensitivity of 18681.82 nm/RIU. The measured results show good agreement with the theoretical predictions. The high sensitivity and the simplicity offer the sensor the potential for many real applications. Accepted version 2013-10-10T07:34:32Z 2019-12-06T21:00:30Z 2013-10-10T07:34:32Z 2019-12-06T21:00:30Z 2012 2012 Journal Article Ji, W. B., Liu, H. H., Tjin, S. C., Chow, K. K., & Lim, A. (2012). Ultrahigh sensitivity refractive index sensor based on optical microfiber. IEEE photonics technology letters, 24(20), 1872-1874. 1041-1135 https://hdl.handle.net/10356/102804 http://hdl.handle.net/10220/16421 10.1109/LPT.2012.2217738 en IEEE photonics technology letters © 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/LPT.2012.2217738]. application/pdf
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Ji, Wen Bin
Liu, Huan Huan
Tjin, Swee Chuan
Chow, Kin Kee
Lim, Anthony
Ultrahigh sensitivity refractive index sensor based on optical microfiber
title Ultrahigh sensitivity refractive index sensor based on optical microfiber
title_full Ultrahigh sensitivity refractive index sensor based on optical microfiber
title_fullStr Ultrahigh sensitivity refractive index sensor based on optical microfiber
title_full_unstemmed Ultrahigh sensitivity refractive index sensor based on optical microfiber
title_short Ultrahigh sensitivity refractive index sensor based on optical microfiber
title_sort ultrahigh sensitivity refractive index sensor based on optical microfiber
topic DRNTU::Engineering::Electrical and electronic engineering
url https://hdl.handle.net/10356/102804
http://hdl.handle.net/10220/16421
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