Reachability-based robustness verification and optimization of SRAM dynamic stability under process variations
The dynamic stability margin of SRAM is largely suppressed at nanoscale due to not only dynamic noise but also process variation. This paper introduces an analog verification for SRAM dynamic stability under threshold-voltage variations. A zonotope-based reachability analysis by the backward Euler m...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2014
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/103118 http://hdl.handle.net/10220/19254 |